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Modeling and Testing of RF/HPM Effects in a Voltage Controlled Oscillator

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: FA9550-10-C-0097
Agency Tracking Number: F09B-T08-0076
Amount: $100,000.00
Phase: Phase I
Program: STTR
Solicitation Topic Code: AF09-BT08
Solicitation Number: 2009.B
Solicitation Year: 2009
Award Year: 2010
Award Start Date (Proposal Award Date): 2010-04-15
Award End Date (Contract End Date): 2011-01-14
Small Business Information
418 Washington Street, SE
Albuquerque, NM 87108
United States
DUNS: 362713141
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 William Zimmerman
 Senior Scientist
 (505) 255-4201
Business Contact
 Donald Voss
Title: Managing Member
Phone: (505) 255-4201
Research Institution
 University of Maryland
 John C Rogers
IREAP, Bldg. 223
College Park, MD 20742
United States

 (301) 405-4957
 Nonprofit College or University

Military applications for the use of directed electromagnetic energy, which include high power microwave (HPM), seek to disrupt electronic systems by exploiting non-linearity in semiconductors. While current mode second breakdown is a thermal non-linearity often exploited, it has been demonstrated that a broad class of semiconductors have more subtle non-linearities that can be utilized to induce upset. For example, “designer waveforms” tailored to specific classes of semiconductors can induce sub-harmonics that can be particularly effective on digital timing circuits. Once induced, these sub-harmonics result in digital upset and it is necessary to recycle power to restore normal circuit operation. The proposed task is to demonstrate the feasibility of modeling the effects of RF/HPM fields on circuits containing Voltage Controlled Oscillators (VCOs). The Phase I task will incorporate and improve current models of the effects of electrical transients on VCOs as well as recent work on the development of a probabilistic electromagnetic coupling model. In addition tests will be carried out on representative VCO circuits in order to validate the model. The specialized waveforms developed during the Phase I and associated Phase II work will enable entirely new classes of missions for HPM and electronic warfare (EW) military applications. BENEFIT: The development of a modeling capability for HPM induced upset of Voltage Controlled Oscillators would have an immediate effect on the ability to predict upset of digital circuits. The resulting models would assist in the development of end-to-end HPM effects codes and the development of waveforms targeted at specific types of equipment. Commercial applications would include modeling of RF susceptibilities, support of EMC/EMI testing of digital equipment, and possible inclusion into design standards.

* Information listed above is at the time of submission. *

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