31e. Pressurized Gas Beam Monitor for Extremely High Intensities

A novel pressurized gasfilled multiRFcavity beam profile monitor has been studied that is simple and robust in highradiation environments. Charged particles passing through each RFcavity in the monitor produce intensitydependent ionized plasma, which changes the gas permittivity. Standard RF techniques to measure the change in quality factor (Q) and frequency (f) as a function of time are then used to determine the change in permittivity and corresponding beam intensity in each cavity in the profile monitor. The sensitivity to beam intensity is adjustable using gas pressure and RF gradient. The performance of the gasfilled beam profile monitor has been numerically simulated to evaluate the sensitivity of permittivity measurements and the effectiveness of calibration strategies. An entire multiRFcavity system has been designed and a demonstration test has been prepared.