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3D Tomographic Scanning Microwave Microscopy with Nanometer Resolution
Award Information
Agency: Department of Defense
Branch: Army
Contract: W911NF-17-P-0073
Agency Tracking Number: A17A-008-0009
Amount:
$147,229.00
Phase:
Phase I
Program:
STTR
Solicitation Topic Code:
A17A-T008
Solicitation Number:
2017.0
Timeline
Solicitation Year:
2017
Award Year:
2017
Award Start Date (Proposal Award Date):
2017-07-20
Award End Date (Contract End Date):
2018-01-30
Small Business Information
23718 Community Street
Los Angeles, CA
91304
United States
DUNS:
080508316
HUBZone Owned:
No
Woman Owned:
No
Socially and Economically Disadvantaged:
No
Principal Investigator
Name: Yan Zhao
Title: CEO
Phone: (424) 345-0067
Email: yan@alcatera.com
Title: CEO
Phone: (424) 345-0067
Email: yan@alcatera.com
Business Contact
Name: Yan Zhao
Phone: (424) 345-0067
Email: yan@alcatera.com
Phone: (424) 345-0067
Email: yan@alcatera.com
Research Institution
Name: Lehigh University
Contact: James Hwang
Address:
Phone: (610) 758-5104
Type: Nonprofit College or University
Contact: James Hwang
Address:
Office of Research & Sponsored Programs
526 Broadhead Ave
Bethlehem, PA
18015
United States
Phone: (610) 758-5104
Type: Nonprofit College or University
Abstract
Near-Field Scanning Microwave Microscopy (SMM) is a technique relying on a raster scan of a microwave probe across a sample surface, while measuring its reflected microwave signal. The existing technologies are limited to the surface analysis, and are not compatible with liquid environment. These limitations are addressed by the proposed wideband 3D tomography SMM with sub-surface analysis capability enabling novel commercial and industrial applications such as semiconductor inspection that require the need of non-invasive material analysis. Likewise, biological sample analysis and threat detection would greatly benefit from such technique.
* Information listed above is at the time of submission. *
