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Plasmonic Metamaterial Approach to Infrared Scene Projection

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: FA8651-17-P-0123
Agency Tracking Number: F17A-022-0191
Amount: $149,952.00
Phase: Phase I
Program: STTR
Solicitation Topic Code: AF17A-T022
Solicitation Number: 2017.0
Solicitation Year: 2017
Award Year: 2017
Award Start Date (Proposal Award Date): 2017-07-06
Award End Date (Contract End Date): 2018-04-09
Small Business Information
1209 W. Gore St.
Orlando, FL 32805
United States
DUNS: 080123658
HUBZone Owned: Yes
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Pedro Figueiredo
 Principal Investigator
 (407) 256-9884
Business Contact
 Robert Peale
Phone: (850) 882-0037
Research Institution
 University of Massachusetts, Boston
 Michael Gaughan
 (617) 287-5449
 Nonprofit College or University

Truventic proposes a novel MEMS-based plasmonic infrared scene projector to support hardware-in-the-loop testing of missile seekers, forward looking IR cameras (FLIR), counter measure simulation and tracking systems. The approach avoids known limitations of resistive arrays and provides high dynamic range, unprecedented high apparent temperature, high modulation rates, high pixel to pixel contrast, and continuous signal. The approach has low power requirements and is fabricated from standard materials by low-cost CMOS processing. The broad collimated beam of a single infrared source is internally reflected from the face of a prism. The intensity of the reflection is spatially modulated using an MEMS array of metal pixels in close proximity to the prism face. The separation between each metal pixel and the prism face is electrically controlled. Excitation of highly localized surface plasmon polaritons (SPPs) on the metal plates draws power out of the reflected beam at the position of the pixel. SPP excitation depends exponentially on the controlled separation, allowing electronic control over a full dynamic range with high intensity resolution and at high frame rates. The spectral band for device testing can be selected arbitrarily by suitable choice of source or filter.

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