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Ultrafast Electron Microscopy Module to Upgrade Existing Commercial Electron Microscopes

Award Information
Agency: Department of Energy
Branch: N/A
Contract: DE-SC0018529
Agency Tracking Number: 0000234447
Amount: $150,000.00
Phase: Phase I
Program: STTR
Solicitation Topic Code: 11a
Solicitation Number: DE-FOA-0001770
Solicitation Year: 2018
Award Year: 2018
Award Start Date (Proposal Award Date): 2018-04-09
Award End Date (Contract End Date): 2019-01-08
Small Business Information
1012 N Walnut Street
Lansing, MI 48906-5061
United States
DUNS: 621290001
HUBZone Owned: Yes
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Chase Boulware
 (517) 999-3475
Business Contact
 Amanda Grimm
Phone: (517) 927-4565
Research Institution
 Michigan State University
 Chong-Yu Ruan
426 Auditorium Rd
East Lansing, MI 48824-1046
United States

 (517) 355-5040
 Nonprofit College or University

This project will develop a flexible longitudinal electron optical system based on high-precision radio-frequency cavities for short and intense electron bunch compressions, both in the energy and time domains. The proposed system is designed to be insertable into an existing transmission electron microscope column to upgrade its temporal resolution. Active phase-space control enables broad ranges of material, nanoscience and technologies applications involving highly demanding ultrafast core-level spectroscopy and ultrafast single-shot material research. The high-dose mode is currently not feasible in commercial systems. While the basic concept has been demonstrated in a customized electron optical column, adapting the same technologies into an existing electron microscope will require delicate design and laboratory tests to ensure robust performance. Niowave, Inc. built the resonant cavity used as a radio-frequency buncher at the test facilities at Michigan State University that were used to demonstrate the concepts of active space-charge control. In this STTR project, Niowave and MSU will partner to develop the next realization of this radiofrequency (RF) lens and make this technology available as a drop-in upgrade for existing commercial electron microscopes. This realization would revolutionize the future of electron microscope design, and could even transform an aging fleet of steady-state electron microscopes into powerful ultrafast imaging and spectroscopy instruments. These systems would be widely used in industrial and academic settings for material characterizations.

* Information listed above is at the time of submission. *

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