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3D Tomographic Scanning Microwave Microscopy with Nanometer Resolution

Award Information
Agency: Department of Defense
Branch: Army
Contract: W911NF-18-C-0094
Agency Tracking Number: A2-7151
Amount: $496,909.00
Phase: Phase II
Program: STTR
Solicitation Topic Code: A17A-T008
Solicitation Number: 17.A
Timeline
Solicitation Year: 2017
Award Year: 2018
Award Start Date (Proposal Award Date): 2018-09-28
Award End Date (Contract End Date): 2019-09-28
Small Business Information
23718 Community St
Canoga Park, CA 91304
United States
DUNS: 080508316
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Yan Zhao
 CEO
 (424) 345-0067
 yan@alcatera.com
Business Contact
 Richard Al Hadi
Phone: (323) 510-8372
Email: richard@alcatera.com
Research Institution
 Lehigh University
 James Hwang James Hwang
 
Office of Research & Sponsored Programs 526 Broadhead Ave
Bethlehem, PA 18015
United States

 (610) 758-5104
 Nonprofit college or university
Abstract

Scanning probe microscopy (SPM) is a technique used to detect near-field interaction when a sample is rater-scanned by a probe. Example include atomic force microscope (AFM) and scanning tunneling microscope (STM). It offers nanometric and atomic image resolution. In this field, an emerging technique, Near-Field Scanning Microwave Microscopy (SMM), utilizes microwave evanescent waves to attain the short-range interaction, which can provide extra quantitative measured data besides the nanometric images. However, existing systems are expensive, and usually limited to a single frequency measurement below 20GHz without exploiting the penetration capabilities of microwave, and are generally incompatible with liquid environments. These limitations are addressed by the proposed wideband 3D tomography SMM with sub-surface analysis capability. It focuses on a novel detection approach that can be extended to very high frequencies.

* Information listed above is at the time of submission. *

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