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Terahertz cyber security testing using artificial intelligence (FA-002)

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: FA8649-19-P-A080
Agency Tracking Number: F19B-001-0094
Amount: $25,000.00
Phase: Phase I
Program: STTR
Solicitation Topic Code: AF19B-T001
Solicitation Number: 19.B
Timeline
Solicitation Year: 2019
Award Year: 2019
Award Start Date (Proposal Award Date): 2019-08-02
Award End Date (Contract End Date): 2020-08-02
Small Business Information
9433 van Arsdale Drive
Vienna, VA 22181
United States
DUNS: 080842424
HUBZone Owned: No
Woman Owned: Yes
Socially and Economically Disadvantaged: No
Principal Investigator
 Paulina Shur
 President, CEO, and Chairwoman of the Board of Directors
 (518) 421-8830
 electronicsoffuture@electronicsoffuture.com
Business Contact
 Paulina Shur
Phone: (518) 421-8830
Email: electronicsoffuture@electronicsoffuture.com
Research Institution
 Florida International University
 Robert Gutierrez Robert Gutierrez
 
10555 W Flagler Street
Miami, FL 33174
United States

 (305) 348-8312
 Nonprofit college or university
Abstract

The focus of this proposal is FA-002 - artificial intelligence (AI), which will be used for the hardware cyber security. AI will link the THz and sub-THz responses at the pins to the defects and deviations from design of the integrated circuits under test. An increasing complexity of digital and mixed-signal systems makes establishing the authenticity of a chip to be a key problem. New rapid, inexpensive, and non-destructive technology is needed to address this problem. We will develop a new terahertz AI testing technique for non-destructive identification of genuine integrated circuits, even in-situ and even under bias, by measuring their response to terahertz and/or sub-terahertz radiation at the circuit pins and using AI algorithms for the response classification and interpretation. A big advantage of this new technique compared to other radiation enhanced testing is that this new approach does not affect the device operation. In contrast to the conventional THz imaging, this technique will use the intensity, polarization, frequency, and bias dependences of the THz response at the VLSI or MMIC pins. Our recent results demonstrated that this technique allowed for the unambiguous identification of the MMIC defective transistors.

* Information listed above is at the time of submission. *

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