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AI/ML for Additive Manufacturing Defect Detection

Award Information
Agency: Department of Defense
Branch: Navy
Contract: N68335-23-C-0051
Agency Tracking Number: N222-117-0164
Amount: $139,650.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: N222-117
Solicitation Number: 22.2
Timeline
Solicitation Year: 2022
Award Year: 2023
Award Start Date (Proposal Award Date): 2022-11-07
Award End Date (Contract End Date): 2023-05-09
Small Business Information
3000 KENT AVENUE, SUITE 1701
WEST LAFAYETTE, IN 47906-1169
United States
DUNS: 161183322
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Benji Loop
 (765) 464-8997
 loop@pcka.com
Business Contact
 Teresa Arens
Phone: (317) 245-1122
Email: tarens@pcka.com
Research Institution
N/A
Abstract

Metal additive manufacturing (AM), particularly, laser powder-bed fusion (LPBF) has transformative potential to achieve geometric design freedom at low production volumes. However, porosity and localized defects remain a significant challenge to implementation in mission critical aerospace applications. While the quality of LPBF is now competitive with or surpasses castings for established materials such as Stainless Steel 304 or 316, increased demands based on enhanced geometry require stringent certification before the printed components can be used in applications experiencing cyclic loading. Researchers at Notre Dame have demonstrated machine learning techniques for analyzing the integrity of printed parts from data stored during the manufacturing process. The main objective of this proposal is to complete the initial design and testing of an Automated Manufacturing Process Analysis System. This device will 1) to eliminate the need to store large amounts of data for post-processing, 2) aggregate and synchronize data from multiple sensors, 3) synthesize data into features and interpolate onto a voxelized space, 4) allow the results of off-line trained machine learning algorithms to be applied forward and 5) enable future layer-to-layer process control.

* Information listed above is at the time of submission. *

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