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High Speed, High Accuracy Stage for Advanced Lithography

Award Information
Agency: Department of Defense
Branch: Defense Advanced Research Projects Agency
Contract: N/A
Agency Tracking Number: 36506
Amount: $98,906.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: N/A
Solicitation Number: N/A
Solicitation Year: N/A
Award Year: 1997
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
461 Boston St.
Topsfield, MA 01983
United States
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Michael Hercher
 (508) 887-6600
Business Contact
Phone: () -
Research Institution

The development of a high-speed, very accurate XY stage for semiconductor lithography is proposed. Key features are: a grid-based metrology system which is immune to turbulence and has subnanometer resolution; a high-speed, light-weight XY stage capable of supporting 12" wafers, and including active control of all six degrees of freedom; and dual-loop servo systems for X and Y to provide fast long-range moves and highly accurate short-range positioning. If successful, this approach will provide all of the capabilities needed for the next generation of steppers for high throughput, high accuracy microlithography. This approach also promises to reduce the cost of the metrology system by at least a factor of two relative to the cost of a comparable, but less capable, laser interferometer system.

* Information listed above is at the time of submission. *

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