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Development of a Picosecond Time Resolution Scanning Force Microscope

Award Information
Agency: Department of Defense
Branch: Defense Advanced Research Projects Agency
Contract: N/A
Agency Tracking Number: 35709
Amount: $99,000.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: N/A
Solicitation Number: N/A
Timeline
Solicitation Year: N/A
Award Year: 1997
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
P.O. Box 130243
Ann Arbor, MI 48113
United States
DUNS: N/A
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Steven Williamson
 (313) 998-4503
Business Contact
Phone: () -
Research Institution
N/A
Abstract

We propose to fabricate and characterize a new, freely-positionable voltage probe that has 2-ps temporal resolution and 200-nm spatial resolution. This probe will retrofit into a conventional scanning force microscope (SFM) environment. It will operate in imaging mode with the same functionality offered by other SFM probes. This same probe can be positioned with sub-micron accuracy and make ultrahigh-sensitivity, absolute-voltage measurement with 2-ps resolution. The ultimate sensitivity of this probe is 10 nV/+Hz, which is 10 5-10 6 times greater than existing probes. Low-voltage measurements of nanoelectronic devices can now be observed, often in real time. These same measurements would take tens of minutes to acquire with other techniques. Also,, we can now test for picosecond timing-jitter in sub-micron VLSI with acquisition times measured in minutes instead of hours. The photoconductive nature of this probe enables this probe to also be used for injecting electrical pulses into a device with this same temporal and spatial resolution. The combination of ultrafine resolution, speed, and sensitivity makes this probe a new and power diagnostic tool for measurement of transient events, in both research and manufacturing. We will work closely with the University of Michigan, to design, and test these probes.

* Information listed above is at the time of submission. *

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