2015 Phase I Release 1

The Department of Energy supports research and facilities in electron and scanning probe microscopy for the characterization of materials. Performance improvements for environmentally acceptable energy generation, transmission, storage, and conversion technologies depend on a detailed understanding of the structural and property characteristics of advanced materials. The enabling feature of nanoscience, as recognized in workshop reports sponsored by the Department of Energy and by the National Nanotechnology Initiative, is the capability to image, manipulate, and control matter and energy on nanometer, molecular, and ultimately atomic scales. These fundamental research areas are strongly tied to the energy mission of the Department, ranging from solar energy, energy storage and conversion technologies, and carbon sequestration. Electron and scanning probe microscopies are some of the primary tools and widely used for characterizing materials. Innovative instrumentation developments offer the promise of radically improving these capabilities, thereby stimulating new innovations in materials science and energy technologies. Major advances are being sought for capability to characterize and understand materials, especially nanoscale materials, in their natural environment at high resolutions typical of electron and scanning probe microscopy and with good temporal resolution. To support this research, grant applications are sought to develop instrumentation capabilities beyond the present state-of-the-art in (a) electron microscopy and microcharacterization, (b) scanning probe microscopy and (c) areas relevant to (a) and (b), such as integrated electron and scanning probe microscopy capabilities.

Electron microscopy and microcharacterization capabilities are important in the materials sciences and are used in numerous research projects funded by the Department. Grant applications are sought to develop components and accessories of electron microscopes that will significantly enhance the capabilities of the electron-based microcharacterization, including improved spatial and temporal resolution in imaging, diffraction and spectroscopy with and without applied stimuli (e.g., temperature, stress, electromagnetic field, and gaseous or liquid environment):

Stages and holders that provide new capabilities for in situ transmission electron microscopy experiments in liquid, gaseous, optoelectronic and/or other extreme environments that also provide capability for simultaneous spectroscopy.

New electron sources that can operate in pulsed modes to femtosecond frequencies. Of particular interest are laser-assisted field emission guns for application to pulsed mode operation as a single purpose apparatus for time-resolved diffraction experiment, or incorporated into a conventional electron microscope to achieve more versatile capabilities. Proposed solutions must demonstrate point-source-emitter capability.

Ultra-high energy resolution and collection efficiency x-ray, electron loss, and/or optical spectrometers compatible with transmission electron microscopy. Analytical electron energy loss spectroscopy approaches include systems able to achieve high energy resolution (10 meV or better), high energy dispersion (>25mm/eV), efficient trapping of the zero-loss-peak (ZLP) so that spectra at energies <1eV will not be dominated by the ZLP “tail”. Energy dispersive spectroscopy approach of interest should include efficient detector materials and improved geometry for maximum signal collection. Single electron detector arrays facilitating ultra high speed counting for electron spectroscopy (~ nanosecond) are of particular interest.

High efficiency and high sensitivity electron detectors. Approaches of interest include CMOSbased electron detectors for high-resolution imaging, detectors with a wide dynamic range (16-20bit) for electron diffraction, and secondary electron detectors for surface imaging.

Systems for automated data collection, processing, and quantification in TEM and/or STEM. Approaches of interest should include (1) hardware and platform-independent software for data collection and visualization, (2) automated measurement and mapping of crystallography, internal magnetic or electric field, or strain, and (3) multi-spectral analysis. Proposed solutions must be demonstrated in TEM or STEM mode.

Questions – contact Jane Zhu, Jane.Zhu@science.doe.gov

Scanning probe microscopy is vital to the advancement of nanoscale and energy science, and is used in numerous materials research projects and facilities funded by the Department. Grant applications are sought to develop: New generations of SPM platforms capable of operation in the functional gas atmospheres and broad temperature/pressure ranges, functional SPM probes, sample holders/cells (including electrochemical and photoelectrochemical cells), and controller/software support for ultrafast, environmental and functional detection. Areas of interest include: (1) SPM platforms capable of imaging in the controlled and reactive gas environments and elevated temperatures for fuel cell, and catalysis research, (2) variable pressure systems with capabilities for surface cleaning and preparation bridging the gap between ambient and ultra-high vacuum platforms, (3) insulated and shielded probes and  electrochemical cells for high-resolution electrical imaging in conductive solutions; (4) heated probes combined with dynamic thermal measurements including thermomechanical, temperature, and integrated with Raman and mass-spectrometry systems, and (5) probes integrated with electrical, thermal, and magnetic field sensors for probing dynamic electrical and magnetic phenomena in the 10 MHz - 100 GHz regime, and (6) SPM platforms and probes for other functional imaging modes (including but not limited to microwave, pumpprobe, etc). Probes and probe/holder assemblies should be compatible with existing commercial hardware platforms, or bundled with adaptation kits. Complementary to this effort is the development of reliable hardware, software, and calibration methods for the vertical, lateral, and longitudinal spring constants of the levers, sensitivities, and frequency-dependent transfer functions of the probes.

SPM platforms designed for SPM combined with other high-resolution structural and chemical characterization modes. Examples include but are not limited to (a) SPM platforms integrated with high-resolution electron beam imaging in transmission and scanning transmission electron microscopy environments, (b) SPM platforms integratable with focused X-ray, (c) imaging modalities providing local chemical information including mass-spectrometry and nanooptical
detection.

A new generation of optical and other cantilever detectors for beam-deflection-based force microscopies. Areas of interest include: (1) low-noise laser  sources and detectors approaching the thermomechanical noise limit, (2) high bandwidth optical detectors operating in the 10-100 MHz regime, and (3) small-spot (sub-3 micron) laser sources for video-rate Atomic Force Microscopy (AFM) measurements. Piezoresistive and tuning-fork force detectors compatible with existing low-temperature high-magnetic field environments are also of interest. Systems for next-generation controllers and stand-alone modules for data acquisition and analysis. Areas of interest include: (1) multiple-frequency and fast detection schemes for mapping energy dissipation, as well as mechanical and other functional properties; (2) active control of tip trajectory, grid, and spectral acquisition; and (3) interactive SPMs incorporating decision making process on the single-pixel level. Proposed systems should include provisions for rapid data collection (beyond the ~1kHz bandwidth of feedback/image acquisition of a standard SPM), processing, and quantification; and hardware and platform-independent software for data collection and visualization, including multispectral and multidimensional image analysis (i.e., for force volume imaging or other spectroscopic imaging techniques generating 3D or 4D data arrays). For rapid data acquisition systems, software and data processing algorithms for data interpretation are strongly  encouraged.

Questions – contact Jane Zhu, Jane.Zhu@science.doe.gov

In addition to the specific subtopics listed above, the Department invites grant applications in other areas that fall within the scope of the topic description above.

Questions – contact Jane Zhu, Jane.Zhu@science.doe.gov

The Office of Basic Energy Sciences (BES), within the DOEs Office of Science, is responsible for current and future user facilities including synchrotron radiation, free electron lasers, and the Spallation Neutron Source (SNS). This topic seeks the development of detector technology to support these user facilities.

Cryogenic X-ray spectrometers, such as transition-edge-sensor (TES) microcalorimeters, are of growing importance at synchrotron light sources. This class of detector combines the efficient X-ray collection of a silicon-drift detector with energy resolution approaching that of a crystal- or grating-based spectrometer. Important applications are X-ray emission spectroscopy, partial-fluorescence-yield NEXAFS, and energy-resolved scattering-momentum experiments. Emerging cryogenic detector technologies include TESs as well as microwave kinetic-inductance detectors (MKIDs), magnetic calorimeters (mag-cals), and superconducting tunnel junctions (STJs). These technologies share the common architecture of a pixelated active area that must be held at extreme cryogenic temperatures (~0.050.3 K). In the case of TESs, expansion to kilopixel-scale arrays with total active areas of hundreds of mm^2 is a near-term goal. Because the cryogenic-sensing elements must be able to observe ambient-temperature samples, X-ray-transmitting windows are a critical enabling technology. Here we solicit development of a type of X-ray windows that has high transmission in the soft-X-ray band of 2501000 eV (K lines of organics and L lines of transition metals): vacuum interfaces. Present, commercially available, high-transmission vacuum windows are made from Beryllium or grid-backed polymers. Those that will support an atmosphere with good transmission down to 250 eV are limited to a diameter of about 10mm. We seek designs with larger active areas. A possibility is a planar window array that could contain multiple, gridded active areas separated by thin support struts we envision that each sub-window might have an open area of 2550 mm^2 and the sub-windows might be separated by supports that are several mm wide-thick. Other ideas are encouraged. The awardee would be expected to develop window designs in coordination with developers of cryogenic sensors (such as ANL or NIST) so that the active areas of the windows and the detector arrays can be matched. Window designs that will support ~0.1 atmosphere (in either direction) with much larger active areas are also sought. Improved vacuum-interface windows would also be applicable to conventional, semiconducting x-ray sensors.

High energy (roughly 30-90 keV) x-rays at synchrotron light sources provide unique information on polycrystallinity and failure modes in lightweight structural materials for advanced transportation applications [1], and on the details of atom bonding in crystalline materials being developed for improved catalytic [2] and energy storage applications [3]. These applications require large area detectors (e.g., &gt; 10 cm2), and spatial resolution ranging from 20-200 microns. Achieving very high spatial resolution at high energies while maintaining high detector quantum efficiency (DQE) is particularly challenging. We are seeking proposals to develop new approaches to large area detectors at high energies in this size range with high DQE and 10,000:1 dynamic range so that x-ray diffraction spots can be recorded simultaneously with diffuse scattering. Frame rates in excess of one image per second are required, and approaches that can in principle be scaled up to 100 Hz or higher frame rates are preferred as well as approaches that allow multiple detectors to work with synchronized data acquisition. Detectors with these characteristics are needed by the Department of Energys Scientific User Facilities, and will enable new capabilities in the study of materials in the fields such as chemistry, materials science, and transportation systems engineering including the development of advanced jet aircraft engines.

In addition to the specific subtopics listed above, the Department invites grant applications in other areas that fall within the scope of the topic description above.

The Office of Basic Energy Sciences, within the DOEs Office of Science, is responsible for current and future synchrotron radiation light sources, free electron lasers, and spallation neutron source user facilities. This topic seeks the development of X-ray optics devices to support the light source user facilities.

Gratings are essential components of synchrotron radiation beamline systems and are used in both monochromators and spectrographs covering the photon energy range up to ~ 3 keV. While traditional ruling machines and holographic recording can provide many of the characteristics required, new lithographic methods based on direct optical writing have the potential to revolutionize grating production. In these methods, a sub-micron light spot or array of spots is produced, and a pattern is written in photoresist on a substrate by scanning the sample on an interferometrically controlled stage. This technique offers arbitrary pattern generation combined with very high throughput. Although some of these techniques are used in mature technologies such as integrated circuit and packaging manufacture, x-ray gratings have some unique challenges such as the use of very thick silicon or metallic substrates and a requirement for high precision control of the groove phase coherence over the full grating surface. We are therefore seeking proposals that aim to demonstrate these new direct write grating patterning techniques and show that the methodology will lead to the commercial marketplace in soft x-ray grating production.

Mirrors are an essential component of all synchrotron and Free Electron Laser (FEL) x-ray beamlines. Current and future projected advances in x-ray source performance have led to an enormous increase in source brightness that is in turn driving mirror figure and finish tolerances to significantly lower values than achievable today. The ability of a manufacturer to make a mirror is fundamentally limited by the in-process metrology that is used to measure the mirror slope and height profiles. We are therefore seeking proposals that aim to substantially improve the precision of manufacture of x-ray mirrors through integration of advanced surface metrology into the manufacturing process. Synchrotron and FEL mirrors are typically characterized by lengths up to 1.2 m, with flat, spherical (5 100 m typical radii), sagittal cylinders ( 5-10 cm sagittal radii) or elliptical shape (typically up to 300 mm long with a factor of 2 change in curvature between the ends). We are therefore seeking proposals that demonstrate new technologies in manufacture and metrology of these classes of mirrors that reduce surface slope and height errors to a range well below 100 nrad and 2 nm (rms) respectively.

In addition to the specific subtopics listed above, the Department invites grant applications in other areas that fall within the scope of the topic description above.