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Aracor

Company Information
Address
425 Lakeside Drive
Sunnyvale, CA 94086 0470
United States



Information

UEI: N/A

# of Employees: N/A


Ownership Information

HUBZone Owned: No

Socially and Economically Disadvantaged: No

Woman Owned: No



Award Charts




Award Listing

  1. AUTOMATED RADIATION/RELIABILITY VLSI QUALIFICATION

    Amount: $49,994.00

    N/A

    SBIRPhase I1990National Aeronautics and Space Administration
  2. X-RAY INSTRUMENTATION FOR IMPROVED SEMICONDUCTOR MANUFACTURING PRODUCTIVITY

    Amount: $224,999.00

    RESEARCH ON UNIQUE SOFT X-RAY WAVE-LENGTH DISPERSIVE INSTRUMENTATION IS PROPOSED TO FULFILL IMPORTANT PROCESS MONITOR NEEDS IN THE SEMICONDUCTOR INDUSTRY. ARACOR EXPERIENCE IN DESIGNING AND SUCCESSFUL ...

    SBIRPhase II1989National Science Foundation
  3. EVALUATION OF X-RAY MICROTOMOGRAPHY FOR ENERGETIC MATERIALS CHARACTERIZATION

    Amount: $64,333.00

    THE DEVELOPMENT OF ADVANCED CHEMICAL SYSTEMS WOULD BENEFIT GREATLY FROM THE AVAILABILITY OF NEW INSPECTION TECHNIQUES WHICH COULD IMAGE MATERIALS WITH SUBMIRCON RESOLUTION. BENEFITS OF SUCH A CAPABILI ...

    SBIRPhase I1989Department of Defense Navy
  4. IMPROVED ENERGY RESOLUTION OF MERCURIC IODIDE DETECTORS BY NON-CONTACT POLISHING (NCP) PROCESSING AND SCANNING PHOTOVOLTAGE (SPV) EVALUATION

    Amount: $49,920.00

    THE NEW COMPOUND SEMICONDUCTOR MATERIAL, MERCURIC IODIDE (HGI2), OFFERS THE POTENTIAL FOR ROOM TEMPERATURE, HIGH STOPPING POWER DETECTORS OF PENETRATING RADIATION. THIS POTENTIAL HAS NOT YET BEEN REAL ...

    SBIRPhase I1989Department of Energy
  5. NDE METHODS FOR MICROSTRUCTURAL CHARACTERIZATION OF METAL-MATRIX COMPOSITES

    Amount: $49,248.00

    N/A

    SBIRPhase I1989National Aeronautics and Space Administration
  6. IMPROVED DETECTOR TECHNOLOGY FOR HIGH-RESOLUTION X-RAY NONDESTRUCTIVE EVALUATION

    Amount: $69,978.00

    N/A

    SBIRPhase I1989Department of Defense Air Force
  7. RADIATION-HARD ANALOG BJT TECHNOLOGY ON BESIO WAFERS

    Amount: $66,345.00

    N/A

    SBIRPhase I1989Department of Defense Air Force
  8. GAAS WAFER TESTING FOR RADIATION-INDUCED TRANSIENT UPSET

    Amount: $67,488.00

    N/A

    SBIRPhase I1989Department of Defense Defense Advanced Research Projects Agency
  9. AUTOMATED IMAGE ANALYSIS OF SOLID PROPULSION SYSTEM DEFECTS

    Amount: $69,869.00

    N/A

    SBIRPhase I1989Department of Defense Air Force
  10. INTERNAL CHARACTERIZATION OF DYNAMICALLY STRESSED MATERIALS

    Amount: $499,870.00

    NASA HAS A STRONG INTEREST IN DEVELOPING ADVANCED STRUCTURALMATERIALS FOR VARIOUS SYSTEM SPPLICATIONS. IN PRACTICE, THEDEVELOPMENT OF NEW, OR THE IMPROVEMENT OF OLD, MATERIALS SYSTEMS IS AN ITERATIVE ...

    SBIRPhase II1988National Aeronautics and Space Administration
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