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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. EXTRACTION OF COPPER AND ZINC FROM MIXED-METAL CYANIDE SOLUTION USING SOLID PHASE EXTRACTION

    SBC: Chromatochem Inc.            Topic: N/A

    REMOVAL OF TOXIC METALS FROM WASTEWATER STREAMS HAS BECOME A PROBLEM OF INCREASING NATIONAL IMPORTANCE, AS A RESULT OF INCREASING CONCERN FOR OUR ENVIRONMENT, AND INCREASINGLY STRINGENT WASTE DISPOSAL REGULATIONS. CHROMATOCHEM, INC., HAS DEVELOPED AN ECONOMICAL AND EFFECTIVE NEW TECHNOLOGY FOR THE REMOVAL OF LOW LEVELS OF TOXIC METAL IONS FROM WASTEWATER STREAMS, USING SOLID PHASE EXTRACTION (SPE) ...

    SBIR Phase I 1993 Environmental Protection Agency
  2. ELECTRON CYCLOTRON RESONANCE (ECR) SEMICONDUCTOR ETCHING PROCESS CONTROL BY ELLIPSOMETRY

    SBC: J. A. Woollam Co., Inc.            Topic: N/A

    THE NEED FOR SMALLER SEMICONDUCTOR DEVICE STRUCTURES FOR USE IN VERY HIGH SPEED MICROELECTRONICS REQUIRES A NEW GENERATION OF PLASMA ETCHING TECHNOLOGY. ECR PROMISES TO PROVIDE FEATURES AS SMALL AS 0.2 MICRONS IN SIZE, AS WELL AS A HIGH DEGREE OF ETCHING ANISOTROPY, SELECTIVITY, ETCH RATES, AND LOW DAMAGE. FOR MANUFACTURING PROCESS CONTROL INVOLVING ECR ETCHING IN PRODUCTION OF ELECTRONICS AND OPT ...

    SBIR Phase II 1993 Department of DefenseArmy
  3. REAL TIME MONITOR AND CONTROL OF MBE GROWTH OF HGCDTE BY SPECTROSCOPIC ELLIOPSOMETRY

    SBC: J. A. Woollam Co., Inc.            Topic: N/A

    II-VI SEMICONDUCTORS, ESPECIALLY HGCDTE, ARE USED EXTENSIVELY IN INFRARED IMAGING AND NIGHT VISION ELECTRONICS. THESE SEMICONDUCTORS HAVE SOFT SURFACES; GROWTH OF DEVICE QUALITY MATERIAL IS DIFFICULT; DEVICE YIELDS ARE LOW, AND COSTS ARE HIGH. THERE IS THUS A GREAT NEED FOR NON-INVASIVE PROCESS CONTROL. RECENTLY OUR COMPANY HAS DEVELOPED IN SITU SPECTROSCOPIC ELLIPSOMETRY FOR THE MONITOR OF AL(X)G ...

    SBIR Phase II 1993 Department of DefenseArmy
  4. Heat Stable Alkaline Phosphatase from Thermophiles

    SBC: J.k. Research            Topic: N/A

    N/A

    SBIR Phase I 1993 Department of DefenseArmy
  5. BIOMECHANICAL PROPERTIES OF RECIPROCATING MOTION FOR DIS- ABLED INDIVIDUALS WHILE CYCLING

    SBC: Motion Transfer Cycling            Topic: N/A

    ALTHOUGH BICYCLES HAVE LONG BEEN USED IN THE REHABILITATION OF NEUROMUSCULAR AND MUCULOSKELETAL CONDITIONS FOR BOTH LOW-ER AND UPPER EXTREMITIES, LITTLE RESEARCH HAS BEEN DONE TO INVESTIGATE THE EFFECTS OF THE TRADITIONAL CIRCULAR CRANKINGMOTION ON PATIENT REHABILITATION. RETURNING A PATIENCT TO OPTIMUM FUNCTION REQUIRES A VARIETY OF MEASURES TO INCREASE STRENGTH, RANGE OF MOTION, ENDURANCE (BOTH ...

    SBIR Phase I 1988 Department of Education
  6. MONOLAYER RESOLUTION CHARACTERIZATION BY VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY (VASE)

    SBC: Woollam J A Co            Topic: N/A

    ELLIPSOMETRY USES POLARIZED LIGHT REFLECTANCE TO CHARACTERIZE SURFACES, INTERFACES, AND THIN FILMS. ELLIPSOMETRY HAS TRADITIONALLY BEEN DONE USING A FEW (USUALLY ONE) DISCRETE ANGLES OF INCIDENCE OF THE LIGHT BEAM WITH A SURFACE NORMAL, AND A FEW SELECTED WAVELENGTHS (FREQUENTLY ONLY 632.8 NM FROM A HENE LASER). RECENTLY IT WAS SHOWN (BY WOOLLAM AND COWORKERS) THAT USING VARIABLE ANGLE OF INCIDENC ...

    SBIR Phase II 1988 Department of DefenseDefense Advanced Research Projects Agency
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