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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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The Characterization and Mitigation of Single Event Effects in Ultra-Deep Submicron (< 90nm) Microelectronics
SBC: Orora Design Technologies, Inc. Topic: DTRA07005Orora Design Technologies proposes to develop electronic design automation (EDA) tools employing minimally invasive circuit design-based methods to mitigate single event effects (SEEs) for next generation Ultra-DSM CMOS (
SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency -
Advanced Technologies for Discrete-Parts Manufacturing
SBC: Modumetal, Inc. Topic: DLA07001The purpose of this SBIR effort is to commercialize an innovative method for the production of Modumetal™ discrete parts. The Phase I effort has demonstrated: (1) The low-cost production of monolithic parts of various scales using a net-shape (additive) manufacturing process, (2) An new production process in which cost and production volume are decoupled, and (3) Significant improvement in pr ...
SBIR Phase II 2008 Department of DefenseDefense Logistics Agency -
Portable Time of Flight Mass Spectrometer for Nuclear Forensics
SBC: CREARE LLC Topic: DTRA08004Analysis of nuclear material samples in the field has many advantages over laboratory analysis. Laboratory analyses can be slow, involve increased expense, lead to additional waste generation and disposal problems, and may introduce errors due to sample degradation or mishandling. In situ analysis mitigates all of these problems. The specific aim of this project is the development of a truly por ...
SBIR Phase I 2008 Department of DefenseDefense Threat Reduction Agency -
OF SILICON DEVICES TO ALPHA PARTICLE RADIATION
SBC: SCIENTIFIC RESEARCH ASSOC., INC. Topic: N/ASOFT ERRORS INDUCED BY IONIZING PARTICLES CONSTITUTE ONE OF THE MOST PRESSING PROBLEMS OF PRESENT SEMICONDUCTOR TECHNOLOGY. HARDENING MEASURES HAVE BEEN ATTEMPTED EMPIRICALLY AND THROUGH CIRCUIT SIMULATION, DESIGN MODIFICATION, AND DEVICE SIMULATION. A NECESSARY COMPONENT TO THESE STUDIES IS AN ACCURATE REPRESENTATION OF CIRCUIT RESPONSE, CHARGE COLLECTED, AND IN SOME CASES THE FUNNEL LENGTH. INSO ...
SBIR Phase I 1983 Department of DefenseDefense Threat Reduction Agency