Award Data

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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until September, 2020.

  1. Real-Time Frequency-Selective Fading Channel Realization Generator

    SBC: Welkin Sciences, LLC            Topic: DTRA122020

    During Phase I and a first Phase II, Welkin Sciences developed the Channel Realization Generator (CReG) algorithm, an enhanced functional replacement for the ACIRF code intended to be embedded into software link simulations and HWIL fading channel simulators. The proposed second Phase II effort will refine the CReG documentation and its software and firmware implementations. Many in the strategic ...

    SBIR Phase II 2018 Department of DefenseDefense Threat Reduction Agency
  2. Novel Methods to Measure Penetrator Dynamics in Multi-Layer Geometries

    SBC: Thornton Tomasetti, Inc.            Topic: DTRA07011

    In Phase I of this effort we analyzed the structural response of a BLU 109 during typical penetration events. Based on these finite element results, we proposed and demsonstrated a simple robust concept for a passive penetrator sensor that identifies the material being penetrated and also correlates strongly with its underground trajectory. Such a sensor would obviously provide valuable informatio ...

    SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency
  3. The Characterization and Mitigation of Single Event Effects in Ultra-Deep Submicron (< 90nm) Microelectronics

    SBC: Orora Design Technologies, Inc.            Topic: DTRA07005

    Orora Design Technologies proposes to develop electronic design automation (EDA) tools employing minimally invasive circuit design-based methods to mitigate single event effects (SEEs) for next generation Ultra-DSM CMOS (

    SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency
  4. SEE Modeling and Mitigation in Ultra-Deep Submicron Microelectronics

    SBC: Microelectronics Research Development Corporation            Topic: DTRA07005

    As technology feature sizes decrease, single event upset (SEU), digital single event transient (DSET), and multiple bit upset (MBU) effects dominate the radiation response of microcircuits. Recent test circuits and test methods have quantified the pulse widths of DSETs generated from heavy-ion strikes on critical microcircuit nodes. These pulse widths have proven to be much larger than previousl ...

    SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency
  5. UGT INSTRUMENTATION FOR ELECTRICAL PARAMETER MEASUREMENT

    SBC: APTEK, Inc.            Topic: N/A

    THIS PROGRAM WILL DEVELOP FIELD INSTRUMENTATION SUITABLE FOR USE IN AN UNDERGROUND (UGT) OR ABOVEGROUND (AGT) RADIATION TEST ENVIRONMENT, FOR THE MEASUREMENT OF ELECTRICAL PROPERTIES OF MATERIALS AS THEY RECOVER FROM IRRADIATION. THE EFFORT WILL CONSIST OF SAMPLE HOLDER AND INSTRUMENTATION DESIGN, RESPONSE ANALYSIS, AND THE FABRICATION OF A LABORATORY TEST SETUP TO SHOW TECHNIQUE FEASIBILITY.

    SBIR Phase II 1991 Department of DefenseDefense Threat Reduction Agency
  6. SENSITIVE LOW Z STRAIN GAGE

    SBC: APTEK, Inc.            Topic: N/A

    THIS ACTIVITY WILL INVESTIGATE THE USE OF PVDF FILM FOR USE AS A LOW Z STRAIN GAGE. THE PVDF MATERIAL IS AN ORDER OF MAGNITUDE MORE SENSITIVE THAN PZT AS A PIEZOELECTRIC MATERIAL AND HAS AN ATOMIC NUMBER MUCH LOWER (LOW Z) THAN PRESENT RESISTIVE STRAIN GAGE MATERIALS. THEREFORE, PVDF AS A STRAIN GAGE WILL BE CAPABLE OF MEASURING MUCH LOWER LEVELS OF STRAIN THAN PRESENT GAGING TECHNIQUES, AND WILL ...

    SBIR Phase II 1991 Department of DefenseDefense Threat Reduction Agency
  7. DEVELOPMENT OF A RESIDUAL IN-SITU STRESS GAUGE

    SBC: Terra Tek Inc.            Topic: N/A

    QUANTITATIVE VERIFICATION OF THE RESIDUAL IN-SITU STRESS FIELD WHICH CREATES THE CONTAINMENT CAGE IS NEEDED TO ASSESS THE FACTOR OF SAFETY AGAINST HYDRAULIC FRACTURING FROM THE CAVITY WALL. PHASE I WILL ESTABLISH THE FEASIBLITY OF DEVELOPING A PASSIVE STRESS GAUGE, ABSENT OF ACTIVE INSTRUMENTATION, AND CAPABLE OF RECORDING THE RESIDUAL IN-SITU STRESS FIELD IMMEDIATELY FOLLOWING THE NUCLEAR DEVICE ...

    SBIR Phase II 1991 Department of DefenseDefense Threat Reduction Agency
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