Award Data

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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until September, 2020.

  1. Lithography Cost Reduction for Rad Hard Integrated Circuits

    SBC: SILICON TECHNOLOGIES, INC.            Topic: DTRA143008

    The DoD faces mounting costs for integrated circuits built with advanced technology. Our proposal addresses mixed-signal ASIC design costs and fabrication costs, notably photomask costs and photolithography costs. The ADONIS 1D design methodology has been demonstrated at technologies ranging from 130nm to 16nm. In Phase I of the program, we used ADONIS to design a reference circuit a high-speed c ...

    SBIR Phase II 2017 Department of DefenseDefense Threat Reduction Agency
  2. Engineering Models for Damage to Structural Components Subjected to Internal Blast Loading

    SBC: Thornton Tomasetti, Inc.            Topic: DTRA08006

    Weidlinger Associates Inc. proposes to develop effective technology for simulating explosive detonations within civil buildings where the propagation of airblast and failure of weak internal walls are strongly coupled. We will conduct a field test program designed to complement other internal detonation testing efforts such as DTRA''s Distinct Cobra, expanding the available database. We will perfo ...

    SBIR Phase II 2009 Department of DefenseDefense Threat Reduction Agency
  3. Novel Methods to Measure Penetrator Dynamics in Multi-Layer Geometries

    SBC: Thornton Tomasetti, Inc.            Topic: DTRA07011

    In Phase I of this effort we analyzed the structural response of a BLU 109 during typical penetration events. Based on these finite element results, we proposed and demsonstrated a simple robust concept for a passive penetrator sensor that identifies the material being penetrated and also correlates strongly with its underground trajectory. Such a sensor would obviously provide valuable informatio ...

    SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency
  4. The Characterization and Mitigation of Single Event Effects in Ultra-Deep Submicron (< 90nm) Microelectronics

    SBC: Orora Design Technologies, Inc.            Topic: DTRA07005

    Orora Design Technologies proposes to develop electronic design automation (EDA) tools employing minimally invasive circuit design-based methods to mitigate single event effects (SEEs) for next generation Ultra-DSM CMOS (

    SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency
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