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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Real-Time Frequency-Selective Fading Channel Realization Generator
SBC: WELKIN SCIENCES, LLC Topic: DTRA122020During Phase I and a first Phase II, Welkin Sciences developed the Channel Realization Generator (CReG) algorithm, an enhanced functional replacement for the ACIRF code intended to be embedded into software link simulations and HWIL fading channel simulators. The proposed second Phase II effort will refine the CReG documentation and its software and firmware implementations. Many in the strategic ...
SBIR Phase II 2018 Department of DefenseDefense Threat Reduction Agency -
Novel Methods to Measure Penetrator Dynamics in Multi-Layer Geometries
SBC: Thornton Tomasetti, Inc. Topic: DTRA07011In Phase I of this effort we analyzed the structural response of a BLU 109 during typical penetration events. Based on these finite element results, we proposed and demsonstrated a simple robust concept for a passive penetrator sensor that identifies the material being penetrated and also correlates strongly with its underground trajectory. Such a sensor would obviously provide valuable informatio ...
SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency -
The Characterization and Mitigation of Single Event Effects in Ultra-Deep Submicron (< 90nm) Microelectronics
SBC: Orora Design Technologies, Inc. Topic: DTRA07005Orora Design Technologies proposes to develop electronic design automation (EDA) tools employing minimally invasive circuit design-based methods to mitigate single event effects (SEEs) for next generation Ultra-DSM CMOS (
SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency -
SEE Modeling and Mitigation in Ultra-Deep Submicron Microelectronics
SBC: MICROELECTRONICS RESEARCH DEVELOPMENT CORPORATION Topic: DTRA07005As technology feature sizes decrease, single event upset (SEU), digital single event transient (DSET), and multiple bit upset (MBU) effects dominate the radiation response of microcircuits. Recent test circuits and test methods have quantified the pulse widths of DSETs generated from heavy-ion strikes on critical microcircuit nodes. These pulse widths have proven to be much larger than previousl ...
SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency -
PDA-Based Portable Data Collection System for Commercial Vehicle Inspection
SBC: INTERNATIONAL ELECTRONIC MACHINES CORPORATION Topic: 02FM1More than 1,300,000 Level 1 commercial vehicle inspections - a safety-critical, time-consuming, often difficult and painstaking process, especially as regards the brake inspection component -- are performed every year in the United States, under all sorts of weather and lighting conditions. The current technology used adds to the complexity and error potential inherent in this important task. In ...
SBIR Phase II 2008 Department of Transportation