You are here

Award Data

For best search results, use the search terms first and then apply the filters
Reset

The Award database is continually updated throughout the year. As a result, data for FY20 is not expected to be complete until September, 2021.

  1. Terahertz Ellipsometry for Reflection-Mode Material Characterization

    SBC: J. A. Woollam Co., Inc.            Topic: A08T013

    As technologies utilizing THz radiation (light) develop, the optical properties for many materials need to be determined accurately as a function of frequency in a variety of applications including: THz threat detection and security screening applications

    STTR Phase II 2009 Department of DefenseArmy
US Flag An Official Website of the United States Government