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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Thickness Measurement Technology for Thin Films on Sapphire Substrate
SBC: ADVANCED COOLING TECHNOLOGIES INC Topic: DMEA16B001Silicon-on-sapphire (SOS) integrated circuits are attracting attention due to their high speed performance and low power consumption. An important aspect of the SOS fabrication process that must be verified to maximize yield is the thickness of the thin films deposited on the sapphire substrate. However, due to the transparent nature of sapphire, current optical metrology tools are not applicable. ...
STTR Phase I 2017 Department of DefenseDefense Microelectronics Activity -
Host-Targeted Antiviral Drugs Providing Rapid, Scalable, Stable, Broad-Spectrum MedicalCountermeasure Against Marburg Virus
SBC: EVRYS BIO LLC Topic: CBD18A002In a pandemic or exposure to weaponized Marburg virus the morbidity, mortality and social unrest that will ensue before vaccines orMilitary operating on foreign soil as well as to the population of the US Homeland. Practically all threat agents of biological origin (except forcertain non-proteinaceous toxins, typically produced by marine organisms and fungi) have their structure and vital function ...
STTR Phase I 2018 Department of DefenseOffice for Chemical and Biological Defense -
Algorithms for Look-down Infrared Target Exploitation
SBC: SIGNATURE RESEARCH, INC. Topic: 1Signature Research, Inc. (SGR) and Michigan Technological University (MTU) propose a Phase I STTR effort to develop a learning algorithm which exploits the spatio-spectral characteristics inherent within IR imagery and motion imagery.Our archive of modelled and labeled data sets will allow our team to thoroughly capture the variable elements that will drive machine learning performance.The overall ...
STTR Phase I 2018 Department of DefenseNational Geospatial-Intelligence Agency -
Thickness Measurement Technology for Thin Films on Sapphire Substrate
SBC: ADVANCED COOLING TECHNOLOGIES INC Topic: DMEA16B001Silicon-on-sapphire (SOS) integrated circuits have achieved popularity due to their high speed performance and low power consumption in radio frequency applications. An important aspect of the SOS fabrication process that must be verified to maximize yield is the thickness of the thin films deposited on the sapphire substrate. However, due to the transparent nature of sapphire, current optical met ...
STTR Phase II 2018 Department of DefenseDefense Microelectronics Activity