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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. High Power Single Frequency Source for Cavity Ring-Down Spectroscopy

    SBC: Aculight Corporation            Topic: N/A

    NIST is using a sensitive optical technique called cavity ring-down detection to permit detection of impurities in semiconductor process gases, which cause substantial losses in manufacturing yield. In order to increase the sensitivity and range of application of this technique, improved single frequency laser sources are required. In particular, lasers providing more power, narrower line-width, b ...

    SBIR Phase II 2004 Department of CommerceNational Institute of Standards and Technology
  2. Monitor for Risk of Structural Collapse

    SBC: Sekos, Inc.            Topic: N/A

    The proposal is to develop a system to monitor fire-induced structural vibrations that provide real time data correlating with structural integrity. The system is designed to bridge an "information void" and provide firefighters with information that can warn of impending collapse. The system, based on accelerometer technology, will monitor structural integrity through the algorithmic analysis of ...

    SBIR Phase II 2004 Department of CommerceNational Institute of Standards and Technology
  3. Dual-Probe CD-AFM Calibration

    SBC: XIDEX CORPORATION            Topic: N/A

    Xidex proposes to demonstrate the feasibility of calibrating a critical-dimension atomic force microscope (CD-AFM) without the use of a reference artifact in such a way that high-precision critical dimensions can be generated independently of changes in probe tip shape. We plan to demonstrate sub-nanometer repeatability for tip-to-tip calibration, and demonstrate single-point critical-dimension me ...

    SBIR Phase II 2004 Department of CommerceNational Institute of Standards and Technology
  4. N/A

    SBC: LYNNTECH INC.            Topic: N/A

    N/A

    SBIR Phase II 2000 Environmental Protection Agency
  5. Development of a Laboratory Scale CD-SAXS Device for Semiconductor Metrology Applications

    SBC: Jordan Valley Semiconductors, Inc.            Topic: N/A

    A semiconductor metrology tool will be developed employing the technique of small-angle x-ray scattering (SAXS) to measure the critical dimension (CD) of patterned device structures. The feasibility of the SAXS technique to measure CD has been shown using high-power synchrotron radiation facilities which are not of practical use to the semiconductor industry. The ultimate project goal is to produc ...

    SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology
  6. The H-Anim+ System: An Open Source Hardware Accelerated Human Avatar Browser API

    SBC: YUMETECH, INC.            Topic: N/A

    Adopting open standards such as the X3D and H-Anim reduce costs and ensure the longevity of applications involving human avatars. However, graphics hardware currently requires customized of vertex shader programming to optimize rendering. Yumetech, Inc. and Vcom3D propose the H-Anim+ Browser API: a generic vertex-skinning scheme for the H-Anim specification. The Phase 1 objective is to develop a g ...

    SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology
  7. Novel Technical Approach to Produce III-N Sample Libraries

    SBC: TECHNOLOGIES & DEVICES INTERNATIONAL,            Topic: N/A

    TDI proposes to produce combinatorial GaN and AlGaN samples library having a wide range of doping and fabricated using a variety of surface treatment conditions. These samples will be grown using novel technological approach based on advanced hydride vapor phase epitaxy (HVPE). This method is known to produce bulk GaN materials with low defect density. Recently, TDI has demonstrated high throughpu ...

    SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology
  8. N/A

    SBC: DTEC SYSTEMS LLC            Topic: N/A

    Not Available Concern regarding debris is expressed in subtopic 19.05 regarding processes, mitigation, and survival of spacecraft in the orbital environment. An important tool in understanding the debris hazard is modeling of the environment to characterize risk. There

    SBIR Phase I 2000 Environmental Protection Agency
  9. N/A

    SBC: Frontier Geosciences Inc.            Topic: N/A

    Not Available NASA has unique data collection requirements to support ground-based testing of rocket engines. Not only is the rapid collection of data important, but the transmission of this information to processing facilities is critical. By combining new electrical interface standards with high speed fiber optic technology, generic transmission systems can be designed which would be capable of ...

    SBIR Phase I 2000 Environmental Protection Agency
  10. Highly Efficient Removal of Mercury From Industrial Flue Gas

    SBC: Frontier Geosciences Inc.            Topic: N/A

    It is estimated that 144-189 megagrams (158-207 tons) of mercury are emitted annually into the atmosphere by anthropogenic sources in the United States. Approximately 87 percent of the mercury is from combustion point sources and 10 percent is from manufacturing point sources. The combustion point sources can be broken down further into four classes: (1) coal-fired utility boilers, (2) municipa ...

    SBIR Phase I 2004 Environmental Protection Agency
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