The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until June, 2020.
SBC: Nanometrology International, Inc. Topic: 9070168TT
Nanometrology International, Inc. (NMI) proposes to demonstrate the feasibility of 3-dimensional (3D) characterization of nanoscale objects using scanning probe microscopy (SPM) with a measurement uncertainty of less than 0.7 nm. To accomplish this task, we propose a novel method of 3D tip characterization and use of an innovative surface reconstruction algorithm recently introduced by NIST and th ...SBIR Phase I 2011 Department of CommerceNational Institute of Standards and Technology