You are here

Home » Reports

Award Data

For best search results, use the search terms first and then apply the filters
Reset

The Award database is continually updated throughout the year. As a result, data for FY20 is not expected to be complete until September, 2021.

Displaying 1 result(s)
 
  • Record 1 TO 1

  1. 3D Tip Characterization and Surface Reconstruction

    SBC: Nanometrology International, Inc.            Topic: 9070168TT

    Nanometrology International, Inc. (NMI) proposes to demonstrate the feasibility of 3-dimensional (3D) characterization of nanoscale objects using scanning probe microscopy (SPM) with a measurement uncertainty of less than 0.7 nm. To accomplish this task, we propose a novel method of 3D tip characterization and use of an innovative surface reconstruction algorithm recently introduced by NIST and th ...

    SBIR Phase I 2011 Department of CommerceNational Institute of Standards and Technology
US Flag An Official Website of the United States Government