Award Data

This Phase 2 project targets the completion of the development of an improved system for the broadcasting of the WWVB signal, as a direct continuation of the Phase 1 project, which successfully validated the proposed approach through a feasibility study and analyses. Objectives of this project include the design of the new modulation scheme and protocol, the development of a new time-code generato ...

AMT Nano, LLC has developed innovative technology for achieving a versatile microrobot platform. The innovation relies on a unique micromolding process, which is low-cost and high-throughput, and high precison. The process achieves versatility by generating deterministic freeform shapes in polymers and nanocomposites. Several perceived benefits accompany the micromolding process. Due to the three- ...

Oscilla Power, Inc. (OPI) is developing a utility-scale wave energy harvester that is enabled by low cost and readily-available magnetostrictive alloys. T his device, which utilizes no moving parts, has the potential to deliver predictable quantities of electric power to coastal utilities, industrial users, and remote facilities at costs competitive with coal or gas. The Phase I project demonstra ...

The ability to electronically identify users and their devices is increasingly becoming an integral part of our interaction with computing platforms. Whether an operating system is contacting the manufacturer's web site to confirm its proper registration and payment today, or a cell phone is broadcasting entrance credentials to a secure physical site tomorrow, it is apparent that identifying infor ...

A semiconductor metrology tool will be developed employing the technique of small-angle x-ray scattering (SAXS) to measure the critical dimension (CD) of patterned device structures. The feasibility of the SAXS technique to measure CD has been shown using high-power synchrotron radiation facilities which are not of practical use to the semiconductor industry. The ultimate project goal is to produc ...

Nanometrology International, Inc. (NMI) proposes to demonstrate the feasibility of 3-dimensional (3D) characterization of nanoscale objects using scanning probe microscopy (SPM) with a measurement uncertainty of less than 0.7 nm. To accomplish this task, we propose a novel method of 3D tip characterization and use of an innovative surface reconstruction algorithm recently introduced by NIST and th ...

Xidex proposes to demonstrate the feasibility of calibrating a critical-dimension atomic force microscope (CD-AFM) without the use of a reference artifact in such a way that high-precision critical dimensions can be generated independently of changes in probe tip shape. We plan to demonstrate sub-nanometer repeatability for tip-to-tip calibration, and demonstrate single-point critical-dimension me ...

This proposal is aimed at developing a full software solution for the next generation advanced optical metrology. Existing simulation tools cannot meet the current and future needs of scattering-based optical metrology for semiconductor manufacturing. Our proposed work will first focus on developing an enhanced RCWA-based simulation engine with advanced algorithms for fast convergence and stabilit ...

CAD CAM technologies have had an immense impact on the product development process in the last two decades. Current technologies, however, have limited knowledge representation and computational capabilities to enable collaboration of design decisions beyond commercial Internet based collaboration tools. In the Phase 1 Lateral Eye proposes to develop a new framework for Knowledge Integrated comput ...

The technical objective of this project is to develop a prototype of a face recognition application in a cloud computing environment utilizing MBARK as the middleware. The application will have a client piece that will run on a mobile device such as a laptop and a server piece that will run on a higher-performance computing cluster. The specific objectives of this development project can be enumer ...