Award Data

THE CONTRACTOR SHALL DEVELOP A FUZZY SET METHODOLOGY FOR UNCERTAINTY ANALYSIS IN PROBABILISTIC SEISMIC SAFETY ASSESSMENT OF NUCLEAR POWER PLANTS. FUZZY SET LOGIC WILL BEUSED FOR COLLECTING, QUANTIFYING AND PROPAGATING SUBJECTIVE,ENGINEERING JUDGEMENT USED IN THE UNCERTAINTY ANALYSIS. IN PHASE I, FEASIBILITY OF THE PROPOSED APPROACH WILL BE DEMONSTRATED BY APPLYING IT TO SELECTED PARTS OF A PROBABI ...

The ability to electronically identify users and their devices is increasingly becoming an integral part of our interaction with computing platforms. Whether an operating system is contacting the manufacturer's web site to confirm its proper registration and payment today, or a cell phone is broadcasting entrance credentials to a secure physical site tomorrow, it is apparent that identifying infor ...

AN "INHALATION SCREENING DOSE COLLAR-STANCHION MONITOR" WITHEMBEDDED MINIATURE THIN-WALL GEIGER-MUELLER RADIATION DETECTORS EVALUATES THE THYROID GLAND FOR NANOCURIE ACTIVITYINVENTORY. THE PRIMARY TECHNICAL OBJECTIVE IS TO ESTABLISH THAT THE "COLLAR-STANCHION MONITOR" WILL BE CAPABLE OF DETECTING WITHIN 15 SECONDS AND WITH 2 SIGMA CONFIDENCE AN ACTIVITY INVENTORY OF 0.7 NANOCURIES OF I-131 DOSE EQ ...

A semiconductor metrology tool will be developed employing the technique of small-angle x-ray scattering (SAXS) to measure the critical dimension (CD) of patterned device structures. The feasibility of the SAXS technique to measure CD has been shown using high-power synchrotron radiation facilities which are not of practical use to the semiconductor industry. The ultimate project goal is to produc ...

Nanometrology International, Inc. (NMI) proposes to demonstrate the feasibility of 3-dimensional (3D) characterization of nanoscale objects using scanning probe microscopy (SPM) with a measurement uncertainty of less than 0.7 nm. To accomplish this task, we propose a novel method of 3D tip characterization and use of an innovative surface reconstruction algorithm recently introduced by NIST and th ...

This proposal is aimed at developing a full software solution for the next generation advanced optical metrology. Existing simulation tools cannot meet the current and future needs of scattering-based optical metrology for semiconductor manufacturing. Our proposed work will first focus on developing an enhanced RCWA-based simulation engine with advanced algorithms for fast convergence and stabilit ...

CAD CAM technologies have had an immense impact on the product development process in the last two decades. Current technologies, however, have limited knowledge representation and computational capabilities to enable collaboration of design decisions beyond commercial Internet based collaboration tools. In the Phase 1 Lateral Eye proposes to develop a new framework for Knowledge Integrated comput ...

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Currently, there are over 10,000 MRI scanners used in the US alone. US citizens today are mobile and many times medical treatments may require MRI scans from several different facilities. Images from MRI scanners can also drift over time. There is a tremendous need for all medical imaging scanners to be on the same level. Sigma-K will develop the commercialization of the ISMRM/NIST MRI Calibration ...

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