Award Data

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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until June, 2020.

  1. 3D Tip Characterization and Surface Reconstruction

    SBC: Nanometrology International, Inc.            Topic: 9070168TT

    Nanometrology International, Inc. (NMI) proposes to demonstrate the feasibility of 3-dimensional (3D) characterization of nanoscale objects using scanning probe microscopy (SPM) with a measurement uncertainty of less than 0.7 nm. To accomplish this task, we propose a novel method of 3D tip characterization and use of an innovative surface reconstruction algorithm recently introduced by NIST and th ...

    SBIR Phase I 2011 Department of CommerceNational Institute of Standards and Technology
  2. A FUZZY SET APPROACH FOR SEISMIC SAFETY MARGINS ASSESSMENT.

    SBC: Eda Consultants            Topic: N/A

    THE CONTRACTOR SHALL DEVELOP A FUZZY SET METHODOLOGY FOR UNCERTAINTY ANALYSIS IN PROBABILISTIC SEISMIC SAFETY ASSESSMENT OF NUCLEAR POWER PLANTS. FUZZY SET LOGIC WILL BEUSED FOR COLLECTING, QUANTIFYING AND PROPAGATING SUBJECTIVE,ENGINEERING JUDGEMENT USED IN THE UNCERTAINTY ANALYSIS. IN PHASE I, FEASIBILITY OF THE PROPOSED APPROACH WILL BE DEMONSTRATED BY APPLYING IT TO SELECTED PARTS OF A PROBABI ...

    SBIR Phase I 1987 Nuclear Regulatory Commission
  3. A Portable Vibrio Cholerae Concentrator for Sensitive Pathogen Detection in Water

    SBC: Omnivis LLC            Topic: None

    This SBIR Phase I project proposes to develop an easy to use, inexpensive, and portable bacterial concentrator to enable more sensitive cholera pathogen (Vibrio cholerae) detection. Cholera affects communities across 41 countries, including Mozambique in 2019 after Cyclone Idai and Yemen in 2017. Current methods used to detect the cholera pathogen in water involves a 3 to 5-day procedure due to th ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  4. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  5. DEVELOP AN INHALATION SCREENING DOSE MONITOR FOR WORKERS AT NUCLEAR POWER PLANTS

    SBC: Mikayola International            Topic: N/A

    AN "INHALATION SCREENING DOSE COLLAR-STANCHION MONITOR" WITHEMBEDDED MINIATURE THIN-WALL GEIGER-MUELLER RADIATION DETECTORS EVALUATES THE THYROID GLAND FOR NANOCURIE ACTIVITYINVENTORY. THE PRIMARY TECHNICAL OBJECTIVE IS TO ESTABLISH THAT THE "COLLAR-STANCHION MONITOR" WILL BE CAPABLE OF DETECTING WITHIN 15 SECONDS AND WITH 2 SIGMA CONFIDENCE AN ACTIVITY INVENTORY OF 0.7 NANOCURIES OF I-131 DOSE EQ ...

    SBIR Phase I 1987 Nuclear Regulatory Commission
  6. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  7. Nanomachine Device for Semiconductor Process Control Monitoring

    SBC: Xallent LLC            Topic: None

    Conventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  8. PREDICTION OF CHECK VALVE PERFORMANCE & DEGRADATION IN NUCLEAR POWER PLANT SYSTEMS

    SBC: Kalsi Engineering, Incorporated            Topic: N/A

    N/A

    SBIR Phase I 1987 Nuclear Regulatory Commission
  9. RISK-BASED ANALYSIS OF TECHNICAL SPECIFICATIONS

    SBC: Applied Biomathematics Inc            Topic: N/A

    N/A

    SBIR Phase I 1987 Nuclear Regulatory Commission
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