Award Data

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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until June, 2020.

  1. 3D Tip Characterization and Surface Reconstruction

    SBC: Nanometrology International, Inc.            Topic: 9070168TT

    Nanometrology International, Inc. (NMI) proposes to demonstrate the feasibility of 3-dimensional (3D) characterization of nanoscale objects using scanning probe microscopy (SPM) with a measurement uncertainty of less than 0.7 nm. To accomplish this task, we propose a novel method of 3D tip characterization and use of an innovative surface reconstruction algorithm recently introduced by NIST and th ...

    SBIR Phase I 2011 Department of CommerceNational Institute of Standards and Technology
  2. A FUZZY SET APPROACH FOR SEISMIC SAFETY MARGINS ASSESSMENT.

    SBC: Eda Consultants            Topic: N/A

    THE CONTRACTOR SHALL DEVELOP A FUZZY SET METHODOLOGY FOR UNCERTAINTY ANALYSIS IN PROBABILISTIC SEISMIC SAFETY ASSESSMENT OF NUCLEAR POWER PLANTS. FUZZY SET LOGIC WILL BEUSED FOR COLLECTING, QUANTIFYING AND PROPAGATING SUBJECTIVE,ENGINEERING JUDGEMENT USED IN THE UNCERTAINTY ANALYSIS. IN PHASE I, FEASIBILITY OF THE PROPOSED APPROACH WILL BE DEMONSTRATED BY APPLYING IT TO SELECTED PARTS OF A PROBABI ...

    SBIR Phase I 1987 Nuclear Regulatory Commission
  3. Analysis of New WWVB Modulation Schemes for Future Broadcast

    SBC: XW, LLC dba Xtendwave            Topic: N/A

    This Phase 2 project targets the completion of the development of an improved system for the broadcasting of the WWVB signal, as a direct continuation of the Phase 1 project, which successfully validated the proposed approach through a feasibility study and analyses. Objectives of this project include the design of the new modulation scheme and protocol, the development of a new time-code generato ...

    SBIR Phase II 2011 Department of CommerceNational Institute of Standards and Technology
  4. Credential Management

    SBC: ECleide (VKD Shoppe, Inc.)            Topic: N/A

    The ability to electronically identify users and their devices is increasingly becoming an integral part of our interaction with computing platforms. Whether an operating system is contacting the manufacturer's web site to confirm its proper registration and payment today, or a cell phone is broadcasting entrance credentials to a secure physical site tomorrow, it is apparent that identifying infor ...

    SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology
  5. DEVELOP AN INHALATION SCREENING DOSE MONITOR FOR WORKERS AT NUCLEAR POWER PLANTS

    SBC: Mikayola International            Topic: N/A

    AN "INHALATION SCREENING DOSE COLLAR-STANCHION MONITOR" WITHEMBEDDED MINIATURE THIN-WALL GEIGER-MUELLER RADIATION DETECTORS EVALUATES THE THYROID GLAND FOR NANOCURIE ACTIVITYINVENTORY. THE PRIMARY TECHNICAL OBJECTIVE IS TO ESTABLISH THAT THE "COLLAR-STANCHION MONITOR" WILL BE CAPABLE OF DETECTING WITHIN 15 SECONDS AND WITH 2 SIGMA CONFIDENCE AN ACTIVITY INVENTORY OF 0.7 NANOCURIES OF I-131 DOSE EQ ...

    SBIR Phase I 1987 Nuclear Regulatory Commission
  6. Development of a Laboratory Scale CD-SAXS Device for Semiconductor Metrology Applications

    SBC: Jordan Valley Semiconductors, Inc.            Topic: N/A

    A semiconductor metrology tool will be developed employing the technique of small-angle x-ray scattering (SAXS) to measure the critical dimension (CD) of patterned device structures. The feasibility of the SAXS technique to measure CD has been shown using high-power synchrotron radiation facilities which are not of practical use to the semiconductor industry. The ultimate project goal is to produc ...

    SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology
  7. Dual-Probe CD-AFM Calibration

    SBC: XIDEX CORPORATION            Topic: N/A

    Xidex proposes to demonstrate the feasibility of calibrating a critical-dimension atomic force microscope (CD-AFM) without the use of a reference artifact in such a way that high-precision critical dimensions can be generated independently of changes in probe tip shape. We plan to demonstrate sub-nanometer repeatability for tip-to-tip calibration, and demonstrate single-point critical-dimension me ...

    SBIR Phase II 2004 Department of CommerceNational Institute of Standards and Technology
  8. Next-generation Simulation Suite for Advanced Optical Metrology

    SBC: RSOFT DESIGN GROUP            Topic: N/A

    This proposal is aimed at developing a full software solution for the next generation advanced optical metrology. Existing simulation tools cannot meet the current and future needs of scattering-based optical metrology for semiconductor manufacturing. Our proposed work will first focus on developing an enhanced RCWA-based simulation engine with advanced algorithms for fast convergence and stabilit ...

    SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology
  9. Ontology based Computational Tools for Distributed CAD

    SBC: Lateral Eye, Inc.            Topic: N/A

    CAD CAM technologies have had an immense impact on the product development process in the last two decades. Current technologies, however, have limited knowledge representation and computational capabilities to enable collaboration of design decisions beyond commercial Internet based collaboration tools. In the Phase 1 Lateral Eye proposes to develop a new framework for Knowledge Integrated comput ...

    SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology
  10. PREDICTION OF CHECK VALVE PERFORMANCE & DEGRADATION IN NUCLEAR POWER PLANT SYSTEMS

    SBC: Kalsi Engineering, Incorporated            Topic: N/A

    N/A

    SBIR Phase I 1987 Nuclear Regulatory Commission
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