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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry
SBC: Sandbox Semiconductor Incorporated Topic: NoneIn this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
A FUZZY SET APPROACH FOR SEISMIC SAFETY MARGINS ASSESSMENT.
SBC: Eda Consultants Topic: N/ATHE CONTRACTOR SHALL DEVELOP A FUZZY SET METHODOLOGY FOR UNCERTAINTY ANALYSIS IN PROBABILISTIC SEISMIC SAFETY ASSESSMENT OF NUCLEAR POWER PLANTS. FUZZY SET LOGIC WILL BEUSED FOR COLLECTING, QUANTIFYING AND PROPAGATING SUBJECTIVE,ENGINEERING JUDGEMENT USED IN THE UNCERTAINTY ANALYSIS. IN PHASE I, FEASIBILITY OF THE PROPOSED APPROACH WILL BE DEMONSTRATED BY APPLYING IT TO SELECTED PARTS OF A PROBABI ...
SBIR Phase I 1987 Nuclear Regulatory Commission -
Analysis of New WWVB Modulation Schemes for Future Broadcast
SBC: XW, LLC dba Xtendwave Topic: N/AThis Phase 2 project targets the completion of the development of an improved system for the broadcasting of the WWVB signal, as a direct continuation of the Phase 1 project, which successfully validated the proposed approach through a feasibility study and analyses. Objectives of this project include the design of the new modulation scheme and protocol, the development of a new time-code generato ...
SBIR Phase II 2011 Department of CommerceNational Institute of Standards and Technology -
A Portable Vibrio Cholerae Concentrator for Sensitive Pathogen Detection in Water
SBC: OMNIVIS INC Topic: NoneThis SBIR Phase I project proposes to develop an easy to use, inexpensive, and portable bacterial concentrator to enable more sensitive cholera pathogen (Vibrio cholerae) detection. Cholera affects communities across 41 countries, including Mozambique in 2019 after Cyclone Idai and Yemen in 2017. Current methods used to detect the cholera pathogen in water involves a 3 to 5-day procedure due to th ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Automated SCAP Tool Validator (ASTV)
SBC: ATC-NY INC Topic: 9010377RThe current testing methods of the NIST Security Content Automation Protocol (SCAP) Validation Program are largely manual and labor-intensive, making comprehensive validation of SCAP-enabled IT security products difficult and time-consuming. ATC-NY will design and develop the Automated SCAP Tool Validator (ASTV) for use with the SCAP Public Validation Test Suite and others. ASTV automates the conf ...
SBIR Phase I 2013 Department of CommerceNational Institute of Standards and Technology -
DEVELOP AN INHALATION SCREENING DOSE MONITOR FOR WORKERS AT NUCLEAR POWER PLANTS
SBC: Mikayola International Topic: N/AAN "INHALATION SCREENING DOSE COLLAR-STANCHION MONITOR" WITHEMBEDDED MINIATURE THIN-WALL GEIGER-MUELLER RADIATION DETECTORS EVALUATES THE THYROID GLAND FOR NANOCURIE ACTIVITYINVENTORY. THE PRIMARY TECHNICAL OBJECTIVE IS TO ESTABLISH THAT THE "COLLAR-STANCHION MONITOR" WILL BE CAPABLE OF DETECTING WITHIN 15 SECONDS AND WITH 2 SIGMA CONFIDENCE AN ACTIVITY INVENTORY OF 0.7 NANOCURIES OF I-131 DOSE EQ ...
SBIR Phase I 1987 Nuclear Regulatory Commission -
3D Tip Characterization and Surface Reconstruction
SBC: Nanometrology International, Inc. Topic: 9070168TTNanometrology International, Inc. (NMI) proposes to demonstrate the feasibility of 3-dimensional (3D) characterization of nanoscale objects using scanning probe microscopy (SPM) with a measurement uncertainty of less than 0.7 nm. To accomplish this task, we propose a novel method of 3D tip characterization and use of an innovative surface reconstruction algorithm recently introduced by NIST and th ...
SBIR Phase I 2011 Department of CommerceNational Institute of Standards and Technology -
Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation
SBC: Nvariate, Inc. Topic: NoneModern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Multimode Chiroptical Spectrometer for Nanoparticle Characterization
SBC: APPLIED NANOFLUORESCENCE, LLC Topic: NoneThis project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...
SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology -
Nanomachine Device for Semiconductor Process Control Monitoring
SBC: XALLENT INC. Topic: NoneConventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology