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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until June, 2020.

  1. Optical Device for Sorting Particles by Size

    SBC: En'urga Inc.            Topic: NA

    This Phase II SBIR project will continue the development of an optical sorter that will be used to estimate drop sizes in sprays. The optical sorter will determine the size of drops in the 0.1 to 10 microns range. Drops in this size range are prevalent in the automobile industry, where the fuel injection pressures have increased tremendously over the past two decades. These newer injectors provide ...

    SBIR Phase II 2018 Department of CommerceNational Institute of Standards and Technology
  2. Precision 10 kV Programmable Voltage Source

    SBC: Low Thermal Electronics, Inc.            Topic: NA

    Low Thermal Electronics, Inc. proposes to design a stand-alone, programmable voltage source capable of supplying precision voltages in the range of zero to 1,000 volts direct current (DC), with options for scaling up to 10,000 volts, and with a total expanded uncertainty (k=2) of less than 10uV/V for the 10,000 volts version. This instrument will improve state-of-the-art measurements in high resis ...

    SBIR Phase II 2018 Department of CommerceNational Institute of Standards and Technology
  3. Multimode Chiroptical Spectrometer for Nanoparticle Characterization

    SBC: Applied Nanofluorescence LLC            Topic: NA

    This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are currently the leading example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that ca ...

    SBIR Phase I 2018 Department of CommerceNational Institute of Standards and Technology
  4. Continuous Learning for Additive Manufacturing Processes Through Advanced Data Analytics

    SBC: Senvol LLC            Topic: NA

    Additive manufacturing (AM) is a promising manufacturing technique for end-use parts that can solve challenges for American manufacturers in many industries, e.g. aerospace, defense, automotive, energy, and healthcare. However, despite the potential that AM offers, the rate of AM adoption in industry is very slow. This is because AM suffers from low repeatability and quality consistency issues, wh ...

    SBIR Phase I 2018 Department of CommerceNational Institute of Standards and Technology
  5. Technology Transfer of Multimodal Biometric Application Resource Kit (MBARK)

    SBC: Ad Harmony            Topic: N/A

    The technical objective of this project is to develop a prototype of a face recognition application in a cloud computing environment utilizing MBARK as the middleware. The application will have a client piece that will run on a mobile device such as a laptop and a server piece that will run on a higher-performance computing cluster. The specific objectives of this development project can be enumer ...

    SBIR Phase II 2011 Department of CommerceNational Institute of Standards and Technology
  6. Analysis of New WWVB Modulation Schemes for Future Broadcast

    SBC: XW, LLC dba Xtendwave            Topic: N/A

    This Phase 2 project targets the completion of the development of an improved system for the broadcasting of the WWVB signal, as a direct continuation of the Phase 1 project, which successfully validated the proposed approach through a feasibility study and analyses. Objectives of this project include the design of the new modulation scheme and protocol, the development of a new time-code generato ...

    SBIR Phase II 2011 Department of CommerceNational Institute of Standards and Technology
  7. 3D Tip Characterization and Surface Reconstruction

    SBC: Nanometrology International, Inc.            Topic: 9070168TT

    Nanometrology International, Inc. (NMI) proposes to demonstrate the feasibility of 3-dimensional (3D) characterization of nanoscale objects using scanning probe microscopy (SPM) with a measurement uncertainty of less than 0.7 nm. To accomplish this task, we propose a novel method of 3D tip characterization and use of an innovative surface reconstruction algorithm recently introduced by NIST and th ...

    SBIR Phase I 2011 Department of CommerceNational Institute of Standards and Technology

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