Award Data

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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until September, 2020.

  1. Construction of a Force Probe for Characterization of Microscale Features

    SBC: INSITUTEC, INC.            Topic: N/A

    The Phase 2 objective is to provide NIST with a modular gauge head unit equipped with InsituTec's standing wave probe technology. The complete gauge head unit will be retrofitted to the NIST M48 which is one of the most precise measuring machines in the world. This unit will enable NIST to achieve the agency's program goal in dimensional metrology which is to provide microscale measurement capacit ...

    SBIR Phase II 2006 Department of CommerceNational Institute of Standards and Technology
  2. A Multi-Representation Architecture for STEP AP210-based PCB Stackup Design and Warpage Analysis

    SBC: INTERCAX, LLC            Topic: N/A

    This effort creates foundations for highly automated simulation tools that predict warpage in printed circuit boards and assemblies (PCAs/PCBs) and chip packages. Our technique, MHS, provides core capabilities to automate warpage and other problems that were impractical until now. MHS extends a multi-representation approach the PI first conceived at Georgia Tech for CAD-CAE interoperability. This ...

    SBIR Phase II 2006 Department of CommerceNational Institute of Standards and Technology
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