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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Irradiated Environmental Chambers
SBC: MEASUREMENT ANALYSIS CORPORATION Topic: N/AUsing a novel concept for humidity control, based on a proprietary saturated air source, MAC will construct and evaluate a prototype of an environmental chamber for use with NIST’s SPHERE UV source, in weathering or other UV degradation studies. The chamber will interface to the exit ports of the SPHERE, maintaining the material coupons, mounted in a standardized sample holder, at a programmed t ...
SBIR Phase II 2012 Department of CommerceNational Institute of Standards and Technology -
Improved Microcalorimeter Detectors for X-Ray Chemical Shift Mapping
SBC: STAR CRYOELECTRONICS, LLC Topic: N/AX-ray fluorescence spectroscopy is a widely used and extremely sensitive analytical technique for qualitative as well as quantitative chemical analysis. Superconducting Transition Edge Sensor (TES) microcalorimeter detectors have now been developed that achieve an energy resolution of 2 eV (full width at half maximum) for 1.5 keV X-rays, which is sufficient to enable the measurement of the small s ...
SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology -
A Compact, Tamper-Resistant, Portable Fingerprint Scanner
SBC: SBG Labs Topic: N/AWith the growing demand for more efficient fingerprinting techniques, live scans are rapidly displacing traditional ink-based methods. Despite improvements in detector and processing technology for capturing and digitizing fingerprints, current equipment falls well short of NIST’s goal of a small, tamper-resistant, battery-powered, handheld scanner. Incumbent equipment suppliers have little comm ...
SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology -
Low-Noise Detector Arrays for Raman Spectroscopy
SBC: Aerius Photonics, LLC. Topic: N/AWe propose to demonstrate near infrared (NIR) InGaAs sensor arrays with 55% lower noise than arrays presently available to improve the sensitivity of current spectroscopy systems. The low noise performance will be enabled by the use of low-noise source follower per detector ROICs, which are also used in astronomy with HgCdTe for low noise measurements. With design improvements to current available ...
SBIR Phase I 2006 Department of CommerceNational Institute of Standards and Technology -
Development of a High Sensitivity Laser-induced Incandescence Instrument for Characterizing Soot and Carbonaceous Particles
SBC: ARTIUM TECHNOLOGIES, INC. Topic: N/AA high sensitivity laser-induced incandescence system is proposed for the detailed characterization of environmental soot. The Phase 1 effort has clearly demonstrated the feasibility of (1) reducing the lower detection limit of soot volume fraction and increasing the overall measurement range by at least 2 orders of magnitude from what is currently achievable, and (2) providing PM particle size me ...
SBIR Phase II 2006 Department of CommerceNational Institute of Standards and Technology -
Holographic Light-Emitting Diode-Based Solar Simulator
SBC: Physical Optics Corporation Topic: N/ANIST is seeking a large area solar simulator to overcome the shortcomings of current solar simulators. To meet this need, Physical Optics Corp. (POC) proposed to develop a new Holographic Light-Emitting-Diode-Based Solar Simulator (HOLIOS) based on holographic gratings, holographic diffuser, high-power light emitting diodes with electronic drivers, collimating and projection optics, and photodetec ...
SBIR Phase I 2006 Department of CommerceNational Institute of Standards and Technology -
Imaging Variable Kinetic Energy Electron Analyzer
SBC: R. Browning Consultants Topic: N/AThe objective of this proposal is to create a prototype imaging variable kinetic energy electron analyzer in the range 0.1 to 8 keV for use with an X-ray excitation source. The imaging analyzer is to have a target imaging spatial resolution of 100 nm. The X-ray excitation source will be a synchrotron light source. The instrument can be described as an X-ray photoelectron spectroscopy (XPS) microsc ...
SBIR Phase I 2006 Department of CommerceNational Institute of Standards and Technology -
Service Management Software for Multi-Modal Interactions
SBC: Beyond Access Communications Topic: N/ASession Control technology, which tracks, controls, and directs all media sessions. Beyond Access proposes to provide feasibility into not only the core Session Control technology, but also an enabling software platform to connect, discover, and manage complex many-to-many multi-modal interaction sessions.
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology -
Large Area Imaging Electron Energy Analyzer
SBC: Synchrotron Research, Inc. Topic: N/AThis project is to assess the feasibility of an instrument to provide energy-filtered electron images of a specimen at least 10mm by 10mm in size, operating over a 50-900eV energy range and suitable for NEXAFS chemical imaging. The applicant proposes to demonstrate feasibility by delivering a suitable electron-optical design along with calculated performance characteristics. Knowledge of the exist ...
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology -
High Throughput Development of Low-Resistance Contact to p-type GaN by Combinatorial Screening of Surface Dopants
SBC: Intematix Corporation Topic: N/AGroup III-nitrides with their wide bandgap properties are one of most promising materials not only in opto-electronics but also in high power and high temperature electronics. A critical issue in device applications of the nitride materials is the metal ohmic contact, which seriously limits the performance and efficiency of nitride-based devices. Finding suitable low-resistance Ohmic contacts for ...
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology