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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY23 is not expected to be complete until September, 2024.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Intelligent Agent Toolset for 4D/RCS Architectures

    SBC: 21ST CENTURY SYSTEMS, INC.            Topic: N/A

    There is an increasing demand for systems with more autonomous operations interacting with other autonomous and human-based systems. What is needed is an architecture bundled with developer tools for the creation of intelligent real-time control systems that marry the talents of modern control theory, software technology, sensory processing, and semantic knowledge representations. It would be a st ...

    SBIR Phase I 2006 Department of CommerceNational Institute of Standards and Technology
  2. Multi-user Collaborative Tools for Immersive Scientific Visualization

    SBC: OPEN TECH, INC.            Topic: N/A

    Open Tech will create an interactive multi-user collaboration product for immersive and desktop scientific visualization. This product will leverage our Virtual Reality Windowing Library to enable an easy to use collaboration interface that includes user lists, radars, maps, avatars, white boards, and virtual presentations. The product will also contain a software framework that enables developers ...

    SBIR Phase II 2006 Department of CommerceNational Institute of Standards and Technology
  3. Low Damage Ion Beam Etching Technique and Method for Compositional Profiling of Thin Multilayer Films

    SBC: 4WAVE, INC.            Topic: N/A

    Thin film multilayers of nanometer scale thickness are fundamental to the future of electronics and communications technologies. Chemical depth profiling by ion etching techniques are critical to the characterization of these structures. A fundamental problem with current ion etching technologies is that typical ion energies (~1k eV to 20 keV) create extensive damage and intermixing of nanometer t ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  4. Intelligent Tools with Ambient-Powered Wirelss Sensors

    SBC: LUNA INNOVATIONS INCORPORATED            Topic: N/A

    Next-generation smart machine tools are currently under research and development. Critical to the success of these tools will be the inclusion of smart sensors. These sensor suites will need to measure physical parameters such as temperature, vibration, pressure and so on. Luna Innovations has extensive experience in developing solar powered wireless systems to transmit sensor data. Luna proposes ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  5. CAD Model and CR and MRI Scan Data to MCNP Input Format Conversion Software

    SBC: White Rock Science            Topic: N/A

    We will develop two programs to process data describing a model geometry and convert it to input acceptable to the Monte Carlo transport codes MCNP and MCNPX. One program will read CAD files in the ACIS solid body SAT format. Solid bodies, surfaces, and cells described in the SAT file will be converted to equivalent MCNP objects where available. Where there is no MCNP equivalent, such as for splin ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
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