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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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An Automated Lapping Apparatus and Process for High-Precision Random Profile Roughness Specimen Fabrication
SBC: X-Wave Innovations, Inc. Topic: 9020268TTThe measurement and quality control for smooth engineering surfaces are becoming more and more important in modern science and technology due to their important engineering functions and high production costs. NIST has frequently received requests from U.S. industry to provide Standard Reference Material (SRM) high-precision, random profile roughness specimens to support smooth surface measurement ...
SBIR Phase II 2013 Department of CommerceNational Institute of Standards and Technology -
Improved Microcalorimeter Detectors for X-ray Chemical Shift Mapping
SBC: STAR CRYOELECTRONICS, LLC Topic: 9020868TTX-ray fluorescence spectroscopy is a widely used and extremely sensitive analytical technique for qualitative and quantitative chemical analysis. Superconducting Transition Edge Sensor (TES) microcalorimeter detectors have now been developed that achieve an energy resolution of 2 eV for 1.5 keV X-rays, which is sufficient to enable the measurement of the small shift of the X-ray line position that ...
SBIR Phase II 2013 Department of CommerceNational Institute of Standards and Technology -
Three-Dimensional Test Materials for Solid Supports
SBC: Prime Synthesis Topic: 9021168RSince 1990, Prime Synthesis, Inc. (PSI) has been a leading manufacturer of controlled pore glass (CPG). It has developed significant expertise in the optimization of physical characteristics and chemical modifications of CPG for a variety of applications. CPG has a unique combination of attributes including a very uniform, three-dimensional, nanopore structure that is dimensionally stable in organ ...
SBIR Phase I 2013 Department of CommerceNational Institute of Standards and Technology -
High-Sensitivity, Low-Cost, Surface-Acoustic-Wave Based Microscale Thermogravimetric Analyzer for Nanoparticle Characterization
SBC: X-Wave Innovations, Inc. Topic: N/ATo meet NIST’s need for development of a new electronic system for microscale thermogravimeter nanoparticle analysis, X-wave Innovations, Inc. (XII) proposes a high-sensitivity, high-accuracy, low-cost, surface-acoustic-wave based microscale thermogravimetric analyzer (SAW-µ-TGA). The proposed approach is based on XII-developed surface acoustic wave (SAW) sensor technology, which is capable of ...
SBIR Phase I 2013 Department of CommerceNational Institute of Standards and Technology -
SCAP Content Editor
SBC: G2, INC. Topic: N/ANIST and G2 have been on the forefront of security automation with the development of the Security Content Automation Protocol (SCAP). However, the barrier to entry for SCAP content creation is the requirement to have in depth knowledge of the underlying specifications. This project aims to allow security experts to create SCAP content without the need to be an expert in the specification. By leve ...
SBIR Phase II 2012 Department of CommerceNational Institute of Standards and Technology -
Improved Microcalorimeter Detectors for X-Ray Chemical Shift Mapping
SBC: STAR CRYOELECTRONICS, LLC Topic: N/AX-ray fluorescence spectroscopy is a widely used and extremely sensitive analytical technique for qualitative as well as quantitative chemical analysis. Superconducting Transition Edge Sensor (TES) microcalorimeter detectors have now been developed that achieve an energy resolution of 2 eV (full width at half maximum) for 1.5 keV X-rays, which is sufficient to enable the measurement of the small s ...
SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology -
An Automated Lapping Apparatus and Process for High- Process for High-Precision Random Profile Roughness Specimen Fabrication
SBC: X-Wave Innovations, Inc. Topic: N/AThe measurement and quality control for smooth engineering surfaces are becoming more and more important in modern science and technology due to their important engineering functions and high production costs. NIST has frequently received requests for U.S. industry to provide Standard Reference Material (SRM) high-precision, random profile roughness specimens to support smooth surface measurements ...
SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology