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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Horizon: Validation of an improved method for rapid characterization of protein aggregates in biologic drugs for increased quality and safety
SBC: OPTOFLUIDICS, INC. Topic: NAOptofluidics and the University of Delaware propose to complete the development of the Horizon technology and carry out validation via a comprehensive multi-site study. The technology is a subvisible particle analyzer pioneered during Phase I. The technology is designed to fill two critical gaps in biopharmaceutical product development: (1) Scientists can count and image particles with current too ...
SBIR Phase II 2017 Department of CommerceNational Institute of Standards and Technology -
A Model-Based Solution to Improve the Accessibility and Affordability of Manufacturing System Simulations
SBC: MBSE Tools, Inc. Topic: NAThe vision is to provide decision-makers with effective, fast, and inexpensive analysis tools to answer "What-If" and "What-Should" questions about manufacturing systems. Value Stream Mapping (VSM) is a modeling methodology with widespread contemporary use in manufacturing, and our strategy is to start with VSM as a deployment beachhead for the eventual deployment of a more generic manufacturing s ...
SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology -
A Multi-Representation Architecture for STEP AP210-based PCB Stackup Design and Warpage Analysis
SBC: INTERCAX, LLC Topic: N/AThis effort creates foundations for highly automated simulation tools that predict warpage in printed circuit boards and assemblies (PCAs/PCBs) and chip packages. Our technique, MHS, provides core capabilities to automate warpage and other problems that were impractical until now. MHS extends a multi-representation approach the PI first conceived at Georgia Tech for CAD-CAE interoperability. This ...
SBIR Phase II 2006 Department of CommerceNational Institute of Standards and Technology