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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Construction of a Force Probe for Characterization of Microscale Features

    SBC: INSITUTEC, INC.            Topic: N/A

    The Phase 2 objective is to provide NIST with a modular gauge head unit equipped with InsituTec's standing wave probe technology. The complete gauge head unit will be retrofitted to the NIST M48 which is one of the most precise measuring machines in the world. This unit will enable NIST to achieve the agency's program goal in dimensional metrology which is to provide microscale measurement capacit ...

    SBIR Phase II 2006 Department of CommerceNational Institute of Standards and Technology
  2. High Quantum Efficiency Fast Detectors for Readout of Scintillators for Gamma Ray Detection

    SBC: VOXTEL, INC.            Topic: HSB062007

    High quantum efficiency (QE), fast (

    SBIR Phase I 2006 Department of Homeland Security
  3. Large Area Silicon X-Ray Spectrometer

    SBC: IntraSpec Inc            Topic: N/A

    This project identifies a new approach to silicon x-ray detector technology wherein: (i) the detector geometry is changed to provide a much lower capacitance for a given active area and volume, (ii) the conventional Si(Li) detector is replaced with a stable, oxide-passivated, low leakage-current, deep sensitive-depth, v-type Si element, and (iii) the conventional FET in the preamplifier is replace ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  4. Tool Condition Monitoring and Diagnostics

    SBC: VulcanCraft            Topic: N/A

    A smart machine tool must be able to monitor its condition and report problems. Every CNC machine should provide an alarm for tool condition problems, including tool wear, much as every automobile has a low oil indicator. Tool wear is particularly important for unattended machining as a worn tool can ruin a part. All current tool condition systems operate "blind" without direct information on curr ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  5. N/A

    SBC: HIGH PERFORMANCE MATERIALS GROUP, LLC            Topic: N/A

    N/A

    SBIR Phase I 2000 Department of DefenseSpecial Operations Command
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