Award Data

Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...

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WE PURPOSE TO DEMONSTRATE THE FEASIBILITY OF SPEECH RECOGNITION ON A VLSI NEUROCOMPUTER. THE SPEECH RECOGNITION SYSTEM PERFORMS SPEAKER-INDEPENDENT RECOGNITION OF SPOKEN ENGLISH LETTERS. THE CURRENT IMPLEMENTATION OF THE SYSTEM, NOW RUNNING ON A SUN 4 WORKSTATION, CLASSIFIES LETTERS OF THE ENGLISH ALPHABET AT 94% ACCURACY - THE BEST REPORTED PERFORMANCE OF ANY SYSTEM ON THIS DIFFICULT TASK. THE HI ...

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ON-WAFER MICROWAVE PROBE MEASUREMENTS HAVE DEMONSTRATED THEIR UNIQUE PERFORMANCE AND PRODUCTIVITY GAINS IN SEMICONDUCTOR RESEARCH, DEVELOPMENT AND PRODUCTION ACTIVITIES. HOWEVER, DEVICE PERFORMANCE CONTINUES TO OUTPACE OUR ABILITY TO MEASURE AT THE WAFER LEVEL. AS PROBE PERFORMANCE CONTINUES INTO MILLIMETER WAVELENGTHS, THE MEASUREMENT CHALLENGE INCREASES. FORMERLY NEGLIGIBLE PROBE CONNECTION PARA ...

MRC PROPOSES TO DEVELOP A SAFETY PERFORMANCE INDICATOR (PI) OF THE ELECTROMAGNETIC (EM) PROTECTION STATUS OF A NUCLEAR POWER PLANT (NPP). WE BELIEVE THAT SUCH A PI IS NEEDED BECAUSE: (1) EM ENVIRONMENTAL POLLUTION IS ON THE INCREASE,(2) ADDITIONAL EM THREATS MUST BE EVALUATED, AND (3) DISRUPTION OF NPP OPERATIONS BY EM EFFECTS CAN AND MUST BE AVOIDED. PREVIOUS STUDIES HAVE ADDRESSED THE ISSUE OF E ...