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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Multi-Spectral Low-Light Imaging
SBC: CANVS CORP. Topic: N/ABased on the extensive theoretical and experimental studies carried out in support of the CANVS/SOCOM Phase-I contract, CANVS has determined what hardware it will deliver under the Phase-II effort. The proposed system configurations were arrived at througha series of decisions taking into account form, fit, function, and the ability for rapid transition into production.
SBIR Phase II 2003 Department of DefenseSpecial Operations Command -
V-PSL and VISI_PSL: A Visual Language and Interactive Tool for PSL Generation
SBC: Computer Aided Process Improvement, Inc. Topic: N/AWe propose developing a prototype of a GUI-based wizard that: ¿ Guides users through the steps that are needed to define their processes using PSL in a visual/textual manner. ¿ Checks for consistency/correctness according to PSL ontology. ¿ Generates the PSL description. We believe that VISI-PSL will facilitate the generation of PSL descriptions to the extent that it will be used by process ...
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology -
Large Area Silicon X-Ray Spectrometer
SBC: IntraSpec Inc Topic: N/AThis project identifies a new approach to silicon x-ray detector technology wherein: (i) the detector geometry is changed to provide a much lower capacitance for a given active area and volume, (ii) the conventional Si(Li) detector is replaced with a stable, oxide-passivated, low leakage-current, deep sensitive-depth, v-type Si element, and (iii) the conventional FET in the preamplifier is replace ...
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology -
Tool Condition Monitoring and Diagnostics
SBC: VulcanCraft Topic: N/AA smart machine tool must be able to monitor its condition and report problems. Every CNC machine should provide an alarm for tool condition problems, including tool wear, much as every automobile has a low oil indicator. Tool wear is particularly important for unattended machining as a worn tool can ruin a part. All current tool condition systems operate "blind" without direct information on curr ...
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology