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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. High Efficiency, Large-Area, 1550 nm InGaAs Photodiodes

    SBC: VOXTEL, INC.            Topic: N/A

    A back-illuminated planar InGaAs photodiode tested to have 95% quantum effiiency (QE) at 1550 nm, area greater than 1 mm2, low capacitance (125 MHz) will be improved. Although the existing Phase I device exhibited bulk material dark current generation better than commercially available devices, the sidewall-generated dark current was found to dominate the noise equiva ...

    SBIR Phase II 2010 Department of CommerceNational Institute of Standards and Technology
  2. 300 mm High Density Temperature Probe Card for Wafer- Level Reliability Testing

    SBC: Celadon Systems Inc.            Topic: N/A

    Historical methods of reliability assessment are less and less effective as device sizes shrink. Already researchers are unable to package the many advanced devices because the act of cutting the wafer and the packaging operation pre-stresses or destroys the devices resulting in unreliable test results. Additionally the increasing cost of fabricating a wafer with advanced integrated circuit techno ...

    SBIR Phase I 2010 Department of CommerceNational Institute of Standards and Technology
  3. Tool Condition Monitoring and Diagnostics

    SBC: VulcanCraft            Topic: N/A

    A smart machine tool must be able to monitor its condition and report problems. Every CNC machine should provide an alarm for tool condition problems, including tool wear, much as every automobile has a low oil indicator. Tool wear is particularly important for unattended machining as a worn tool can ruin a part. All current tool condition systems operate "blind" without direct information on curr ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
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