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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Construction of a Force Probe for Characterization of Microscale Features

    SBC: INSITUTEC, INC.            Topic: N/A

    The Phase 2 objective is to provide NIST with a modular gauge head unit equipped with InsituTec's standing wave probe technology. The complete gauge head unit will be retrofitted to the NIST M48 which is one of the most precise measuring machines in the world. This unit will enable NIST to achieve the agency's program goal in dimensional metrology which is to provide microscale measurement capacit ...

    SBIR Phase II 2006 Department of CommerceNational Institute of Standards and Technology
  2. HIGH EFFICIENCY COMPACT MODELING OF RADIATION EFFECTS

    SBC: Lynguent, Inc.            Topic: DTRA05001

    The objective of this research is to develop beta versions of tools for automatically migrating radiation effects predicted in TCAD level tools to compact modeling tools. This transition will enable compact models that possess radiation effects to be quickly generated, which can then be used in circuit design activity. This approach is a substantial improvement over the current ad hoc approaches. ...

    SBIR Phase II 2006 Department of DefenseDefense Threat Reduction Agency
  3. Construction of a Force Probe for Characterization of Microscale Features

    SBC: INSITUTEC, INC.            Topic: N/A

    The pressing need exists within industry to accurately measure high aspect ratio microscale structures. For example, diesel injector nozzles are manufactured with microscale holes ranging from 50-200 micrometers in diameter and 3-5 mm depths. One fundamental challenge is to nondestrucvely measure these features in order to validate models, enhance manufacturing processes, and reduce fuel emissions ...

    SBIR Phase I 2005 Department of CommerceNational Institute of Standards and Technology
  4. HIGH EFFICIENCY COMPACT MODELING OF RADIATION EFFECTS

    SBC: Lynguent, Inc.            Topic: DTRA05001

    The objective of this research is prove the feasibility of automatically migrating radiation effects predicted in TCAD level tools to compact modeling tools. This transition will enable compact models that possess radiation effects to be quickly generated, which can then be used in circuit design activity. This "model-in-a-day" approach is a substantial improvement over the current ad hoc approach ...

    SBIR Phase I 2005 Department of DefenseDefense Threat Reduction Agency
  5. Large Area Silicon X-Ray Spectrometer

    SBC: IntraSpec Inc            Topic: N/A

    This project identifies a new approach to silicon x-ray detector technology wherein: (i) the detector geometry is changed to provide a much lower capacitance for a given active area and volume, (ii) the conventional Si(Li) detector is replaced with a stable, oxide-passivated, low leakage-current, deep sensitive-depth, v-type Si element, and (iii) the conventional FET in the preamplifier is replace ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  6. Tool Condition Monitoring and Diagnostics

    SBC: VulcanCraft            Topic: N/A

    A smart machine tool must be able to monitor its condition and report problems. Every CNC machine should provide an alarm for tool condition problems, including tool wear, much as every automobile has a low oil indicator. Tool wear is particularly important for unattended machining as a worn tool can ruin a part. All current tool condition systems operate "blind" without direct information on curr ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
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