Award Data

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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until June, 2020.

  1. Development and Prototyping of a Digital Pulse Processor for Improved Coincidence Detection, Rejection, and Pulse Recovery, for High Count-Rate Silicon Drift Detectors

    SBC: 4pi Analysis, Inc.            Topic: N/A

    The recent emergence of the Silicon Drift detector (SDD), for use in energy dispersive x-ray spectrometry (EDS), has made possible x-ray event streams with count rates as high as 1-10 Mcps. A problem with existing digital signal processing, as applied to SDDs, is the significant presence of coincidence peaks above the x-ray background. These coincidence peaks occur with amplitudes comparable to lo ...

    SBIR Phase II 2009 Department of CommerceNational Institute of Standards and Technology
  2. Dynamic Light Scattering Instrumentation Using Field Programmable Gate Array-based Digital Signal Processing

    SBC: VOXTEL, INC.            Topic: N/A

    An existing low-cost FPGA-based processing platform will be demonstrated with fiber-coupling to single-photon detectors, to perform photon-arrival time stamping with

    SBIR Phase I 2009 Department of CommerceNational Institute of Standards and Technology
  3. High Efficiency, Large-area, 1550 nm InGaAs Photodiodes

    SBC: VOXTEL, INC.            Topic: N/A

    A stable, well characterized InGaAs materials growth and photodetector fabrication process will be used to fabricate matched photodiodes optimized for balanced homodyne detection. The 1-mm-diameter p-i-n photodetectors will be manufactured back-illuminated with a 5-micron absorber, allowing residual light to reflect off the front-side metal to make a double pass through the active layer. Ultra-hig ...

    SBIR Phase I 2009 Department of CommerceNational Institute of Standards and Technology
  4. Efficient Low-Dark-Count Detector for Photon Counting

    SBC: VOXTEL, INC.            Topic: N/A

    Voxtel has demonstrated efficient high-speed photon counting with thresholded linear-mode avalanche photodiode (APD) receivers using multi-gain-stage InGaAs/InAIAs APDs. In contrast to Geiger APDs, thresholded photon-counting linear APD receivers are thought not to suffer afterpulsing, and can support maximum count rates (MCR) up to 2 or 3 orders of magnitude faster than Geiger APDs. However, the ...

    SBIR Phase II 2009 Department of CommerceNational Institute of Standards and Technology
  5. Construction of a Force Probe for Characterization of Microscale Features

    SBC: INSITUTEC, INC.            Topic: N/A

    The Phase 2 objective is to provide NIST with a modular gauge head unit equipped with InsituTec's standing wave probe technology. The complete gauge head unit will be retrofitted to the NIST M48 which is one of the most precise measuring machines in the world. This unit will enable NIST to achieve the agency's program goal in dimensional metrology which is to provide microscale measurement capacit ...

    SBIR Phase II 2006 Department of CommerceNational Institute of Standards and Technology
  6. Optically clear multi-layered protective window/sensor film for use on rotary wing aircraft

    SBC: UNITED PROTECTIVE TECHNOLOGIES, LLC            Topic: SOCOM04002

    Since the inception of windscreens on aircraft, the effects of erosion on the transparent materials utilized for this application has been problematic. With the development of faster aircraft, Night Vision Goggles and various sensors which utilize electromagnetic waves in the visible and IR ranges this problem has been intensified. The team at United Protective Technologies, propose to provide dat ...

    SBIR Phase I 2004 Department of DefenseSpecial Operations Command
  7. Tool Condition Monitoring and Diagnostics

    SBC: VulcanCraft            Topic: N/A

    A smart machine tool must be able to monitor its condition and report problems. Every CNC machine should provide an alarm for tool condition problems, including tool wear, much as every automobile has a low oil indicator. Tool wear is particularly important for unattended machining as a worn tool can ruin a part. All current tool condition systems operate "blind" without direct information on curr ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
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