Award Data

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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until June, 2020.

  1. An Automated Lapping Apparatus and Process for High-Precision Random Profile Roughness Specimen Fabrication

    SBC: X-Wave Innovations, Inc.            Topic: 9020268TT

    The measurement and quality control for smooth engineering surfaces are becoming more and more important in modern science and technology due to their important engineering functions and high production costs. NIST has frequently received requests from U.S. industry to provide Standard Reference Material (SRM) high-precision, random profile roughness specimens to support smooth surface measurement ...

    SBIR Phase II 2013 Department of CommerceNational Institute of Standards and Technology
  2. WS-BD Conformant Handheld Multi-biometric Acquisition System

    SBC: Fulcrum Biometrics, LLC            Topic: 9010477TT

    Secure trusted biometric validation of identity has never been more important. The increase in global terrorism, unfettered identity theft and new legislation requiring multi-factor authentication are a few of the driving factors. The biometrics industry has not actively responded to the changing market conditions being driven by the explosion in mobile computing. Millions of new mobile devices ar ...

    SBIR Phase II 2013 Department of CommerceNational Institute of Standards and Technology
  3. Query-Based Interoperability for Simulation of Composite Structures

    SBC: INTACT SOLUTIONS INC.            Topic: 9020673R

    We propose to design and implement a query-based approach to interoperable modeling and simulation of composite material structures, that usually contain the manufacturing recipe within their design. In Phase I, we established the feasibility of the approach using a demonstration scenario of CAD/CAE interoperability for assemblies. In Phase II, we propose to develop a series of use-case scenarios ...

    SBIR Phase II 2013 Department of CommerceNational Institute of Standards and Technology
  4. Inline Material Electrical Characterization Sensor (IMECS)

    SBC: PANERATECH, INC.            Topic: N/A

    There is no capability to rapidly assess the electrical properties of nanofiber films during manufacturing and prepregging process. Continuous monitoring of these films will guide the U.S. nanofiber manufacturing industry in optimizing and increasing the yield rate with proper process optimization and avoid any inconsistency in the process and the cost with associated waste material. To address th ...

    SBIR Phase II 2013 Department of CommerceNational Institute of Standards and Technology
  5. Improved Microcalorimeter Detectors for X-ray Chemical Shift Mapping

    SBC: STAR CRYOELECTRONICS LLC            Topic: 9020868TT

    X-ray fluorescence spectroscopy is a widely used and extremely sensitive analytical technique for qualitative and quantitative chemical analysis. Superconducting Transition Edge Sensor (TES) microcalorimeter detectors have now been developed that achieve an energy resolution of 2 eV for 1.5 keV X-rays, which is sufficient to enable the measurement of the small shift of the X-ray line position that ...

    SBIR Phase II 2013 Department of CommerceNational Institute of Standards and Technology
  6. Automated SCAP Tool Validator (ASTV)

    SBC: ATC-NY, Inc.            Topic: 9010377R

    The current testing methods of the NIST Security Content Automation Protocol (SCAP) Validation Program are largely manual and labor-intensive, making comprehensive validation of SCAP-enabled IT security products difficult and time-consuming. ATC-NY will design and develop the Automated SCAP Tool Validator (ASTV) for use with the SCAP Public Validation Test Suite and others. ASTV automates the conf ...

    SBIR Phase I 2013 Department of CommerceNational Institute of Standards and Technology
  7. Bragg Grating Enhanced Narrowband Single Photon SPDC Source

    SBC: Gener8, Inc.            Topic: 9010177TT

    Spontaneous Parametric Down conversion (SPDC) is currently an active research area in quantum communications (QC) to develop entangled single photon sources. However, the bandwidth of current SPDC sources is too broad for many applications. NIST researchers have modeled a solution to this problem that reduces the bandwidth by >50. We proposed to fabricate a prototype of the NIST device by developi ...

    SBIR Phase I 2013 Department of CommerceNational Institute of Standards and Technology
  8. Flowing Water Optical Power Meter for Laser Measurements

    SBC: High Precision Devices, Inc.            Topic: N/A

    High Precision Devices, Inc. (HPD) proposes to use the Phase I SBIR as a vehicle to develop and market a commercially viable 25kW flowing water optical power meter (FWOPM) for industrial, research, and government applications. Building upon existing and fundamentally sound NIST design, and without sacrificing quality or accuracy, HPD will reduce costs and increase manufacturability using best prac ...

    SBIR Phase I 2013 Department of CommerceNational Institute of Standards and Technology
  9. Smart Manufacturing Workflow Environment

    SBC: Nimbis Services, Inc.            Topic: N/A

    Nimbis in partnership with UCLA and Smart Manufacturing Leadership Coalition (SMLC) will provide an open workflow environment that supports the sequential execution of 3rd party APPS using net-worked information based modeling and data analytic technologies to integrate manufacturing intelligence across an entire manufacturing ecosystem. The SMWE leverages Nimbis commercial cloud technical analysi ...

    SBIR Phase I 2013 Department of CommerceNational Institute of Standards and Technology
  10. High Speed Imaging Spectropolarimeter for Dynamic Samples

    SBC: Polaris Sensor Technologies, Inc.            Topic: 9020663R

    Spectroscopic ellipsometry is recognized as the gold standard in noncontact characterization of the refractive index and thickness of a thin optical film or film stack on a substrate. However, it suffers from a number of shortcomings, perhaps the most important of which is the time required to perform a single measurement. Moreover, manufacturers are interested in comprehensive evaluation of thin ...

    SBIR Phase I 2013 Department of CommerceNational Institute of Standards and Technology
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