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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until April, 2020.

  1. Multimode Chiroptical Spectrometer for Nanoparticle Characterization

    SBC: Applied Nanofluorescence LLC            Topic: None

    This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  2. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  3. A Portable Vibrio Cholerae Concentrator for Sensitive Pathogen Detection in Water

    SBC: Omnivis LLC            Topic: None

    This SBIR Phase I project proposes to develop an easy to use, inexpensive, and portable bacterial concentrator to enable more sensitive cholera pathogen (Vibrio cholerae) detection. Cholera affects communities across 41 countries, including Mozambique in 2019 after Cyclone Idai and Yemen in 2017. Current methods used to detect the cholera pathogen in water involves a 3 to 5-day procedure due to th ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  4. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  5. Nanomachine Device for Semiconductor Process Control Monitoring

    SBC: Xallent LLC            Topic: None

    Conventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  6. Multimode Chiroptical Spectrometer for Nanoparticle Characterization

    SBC: Applied Nanofluorescence LLC            Topic: NA

    This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are currently the leading example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that ca ...

    SBIR Phase I 2018 Department of CommerceNational Institute of Standards and Technology
  7. Continuous Learning for Additive Manufacturing Processes Through Advanced Data Analytics

    SBC: Senvol LLC            Topic: NA

    Additive manufacturing (AM) is a promising manufacturing technique for end-use parts that can solve challenges for American manufacturers in many industries, e.g. aerospace, defense, automotive, energy, and healthcare. However, despite the potential that AM offers, the rate of AM adoption in industry is very slow. This is because AM suffers from low repeatability and quality consistency issues, wh ...

    SBIR Phase I 2018 Department of CommerceNational Institute of Standards and Technology
  8. Optical Device for Sorting Particles by Size

    SBC: En'urga Inc.            Topic: NA

    This Phase II SBIR project will continue the development of an optical sorter that will be used to estimate drop sizes in sprays. The optical sorter will determine the size of drops in the 0.1 to 10 microns range. Drops in this size range are prevalent in the automobile industry, where the fuel injection pressures have increased tremendously over the past two decades. These newer injectors provide ...

    SBIR Phase II 2018 Department of CommerceNational Institute of Standards and Technology
  9. Precision 10 kV Programmable Voltage Source

    SBC: Low Thermal Electronics, Inc.            Topic: NA

    Low Thermal Electronics, Inc. proposes to design a stand-alone, programmable voltage source capable of supplying precision voltages in the range of zero to 1,000 volts direct current (DC), with options for scaling up to 10,000 volts, and with a total expanded uncertainty (k=2) of less than 10uV/V for the 10,000 volts version. This instrument will improve state-of-the-art measurements in high resis ...

    SBIR Phase II 2018 Department of CommerceNational Institute of Standards and Technology
  10. Fiber Pigtailed On-Chip Mid-infrared Difference Frequency Generation in Silicon

    SBC: Omega Optics, Inc.            Topic: NA

    We propose a fiber-pigtailed strained silicon platform for tunable difference frequency generation (DFG) in mid-infrared (MIR) with tunable continuous wave near-infrared (NIR) sources. Stress exerted by silicon nitride induces second-order nonlinear susceptibility c(2) on underlying centro-symmetric silicon. NIR light is coupled into silicon and MIR light is coupled out of silicon using sub-wavele ...

    SBIR Phase II 2017 Department of CommerceNational Institute of Standards and Technology

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