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The Award database is continually updated throughout the year. As a result, data for the given year is not complete until April of the following year. Annual Reports data is a snapshot of agency reported information for that year and hence might look different from the live data in the Awards Information charts.

  1. Optimized X-ray Microscope (OXM) for IC Reverse Engineering

    SBC: Xradia            Topic: DMEA122001

    Nondestructive 3D imaging of the interconnect structure of microelectronics with x-rays has been demonstrated on an Xradia microscope at the synchrotron. The same scanning speed can be obtained in a non-synchrotron optimized x-ray microscope (OXM) by taking advantage of recent advancement in x-ray source and x-ray optics technology to be developed in the proposed project. The OXM will allow nondes ...

    SBIR Phase I 2012 Department of DefenseDefense Microelectronics Activity
  2. High Speed, High Resolution X-ray System for Inspecting Integrated Circuits


    A new type of x-ray microscope is proposed for three-dimensional imaging of integrated circuits, or IC"s. The new microscope can image at resolutions down to 25 nm, and at speeds of over 10 million pixels per second. This imaging rate is over 1000x faster than existing high-resolution x-ray systems, and can image a full 1 cm chip in a few hours; existing x-ray microscopes would take years to ...

    SBIR Phase I 2012 Department of DefenseDefense Microelectronics Activity

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