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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Prediction of Equivalent System Temperature: A Computer Methodology

    SBC: Applied Data Trends, Inc.            Topic: N/A

    There is a global trend towards utilization of satellite communications for information services. Equivalent system temperature, Ts, is a significant parameter in quantifying the antenna system/link performance, because it represents the noise power spectral density in antenna system figures-of-merit, such as receiver gain/system temperature (G/T), and end-to-end Signal to Noise Ratio (SNR). Unf ...

    SBIR Phase II 1996 Department of Commerce
  2. Software Tools for Static Analysis of Pointer Usage

    SBC: CFD RESEARCH CORPORATION            Topic: N/A

    Mistakes made by programmers in the use of pointer variables and dynamic memory allocation is a significant cource of software errors. The development of a suite of tools to aid in the detection of these errors is addressed. These tools will operate both statically and dynamically in order to provide as wide a range of services as possible. The static tool will guarantee that certain pointer ba ...

    SBIR Phase I 1996 Department of Commerce
  3. Seismic Detection of Tornados

    SBC: Engineering Analysis Inc            Topic: N/A

    N/A

    SBIR Phase I 1996 Department of Commerce
  4. High Speed Imaging Spectropolarimeter for Dynamic Samples

    SBC: POLARIS SENSOR TECHNOLOGIES INC            Topic: 9020663R

    Spectroscopic ellipsometry is recognized as the gold standard in noncontact characterization of the refractive index and thickness of a thin optical film or film stack on a substrate. However, it suffers from a number of shortcomings, perhaps the most important of which is the time required to perform a single measurement. Moreover, manufacturers are interested in comprehensive evaluation of thin ...

    SBIR Phase I 2013 Department of CommerceNational Institute of Standards and Technology
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