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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until April, 2020.

  1. On-Wafer Measurement Accuracy Assessment Tool Kit

    SBC: Cascade Microtech, Inc.            Topic: N/A

    The traceability of on-wafer calibration standards has long been an issue among the microwave measurement community, and the proliferation of new calibration methods, elements, and applications only exacerbates the problem. This diversity in calibration needs has made traceability of a physical reference impractical. As a result, the NIST developed a procedure which can compare on-wafer calibrat ...

    SBIR Phase I 1995 Department of Commerce
  2. Rectifying Junctions for High Temperature, High Power Electronics

    SBC: 3c Semiconductors            Topic: N/A

    N/A

    SBIR Phase I 1995 Department of DefenseMissile Defense Agency

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