You are here
Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
-
Rectifying Junctions for High Temperature, High Power Electronics
SBC: 3c Semiconductors Topic: N/AN/A
SBIR Phase I 1995 Department of DefenseMissile Defense Agency -
A Novel Sputtering Technique for Deposition of Robust Buffer Layers Suitable for HTS Technology
SBC: APPLIED THIN FILMS, INC Topic: N/AThe objective of this proposed effort is to identify and develop new and robust buffer layer materials for the recently developed metal-coated YBCO superconducting tape technology. While the current choice of yttria stabilized zirconia (YSZ) and cerium oxide as buffer layers has been appropriate for demonstration of coated tapes with current densities over 106 A/cm2, they may not serve all the req ...
SBIR Phase I 1998 Department of DefenseMissile Defense Agency -
On-Wafer Measurement Accuracy Assessment Tool Kit
SBC: Cascade Microtech, Inc. Topic: N/AThe traceability of on-wafer calibration standards has long been an issue among the microwave measurement community, and the proliferation of new calibration methods, elements, and applications only exacerbates the problem. This diversity in calibration needs has made traceability of a physical reference impractical. As a result, the NIST developed a procedure which can compare on-wafer calibrat ...
SBIR Phase I 1995 Department of Commerce -
RESISITVE HEAT CURED RESIN TRANSFER MOLDING OF ADVANCED COMPOSITES
SBC: Conductive Composites Tech,inc Topic: N/AWE PROPOSE TO DEVELOP A NEW METHOD OF RESIN TRANSFER MOLDING (RTM) FOR ADVANCED COMPOSITES MANUFACTURING IN WHICH THE HEAT REQUIRED FOR CURING IS PROVIDED BY PASSING AN ELECTRICAL CURRENT THROUGH ELECTRICALLY CONDUCTIVE GRAPHITE FIBERS IN THE PREFORM. THIS METHOD, WHICH WE DESIGNATE RESISTIVE-HEAT CURED RTM OR RHCRTM, WILL OFFER THE FOLLOWING ADVANTAGES OVER CONVENTIONAL RTM IN WHICH HEAT IS PROVI ...
SBIR Phase II 1995 Department of Commerce -
Laser Polarimetric Apparatus for Rapid Emissivity Measurements on Pulse-Heated Materials
SBC: Containerless Research, Inc. Topic: N/AN/A
SBIR Phase I 1995 Department of Commerce -
Platinum Silicide Micromechanical Infrared Photon Detector
SBC: ENVIRONMENTAL ENGINEERING GROUP, INC. Topic: N/AThe proposed work is intended to lead to the development of a revolutionary class of photon detectors capable of operating at ambient temperatures with fast response times. Specific benefits of the proposed detector include: i) Low cost versions can readily be reduced-to-practice due to inherent simplicity of the sensing element compared to existing photon or thermal detectors, ii) there is no nee ...
SBIR Phase I 1998 Department of DefenseMissile Defense Agency -
High-Voltage, High Rep-Rate UWB Source with Ferroelectric Trigger
SBC: FARR RESEARCH, INC. Topic: N/AWe propose here a ferroelectric trigger for a UWB source with high voltages and operated at high rep rate. This trigger will be simpler and more reliable than existing designs, and will be implemented at lower cost. In addition, this trigger will allow operation at much higher rep rates than existing designs. Finally, the proposed switch will have a lower jitter than competing designs. During Pha ...
SBIR Phase I 1998 Department of DefenseMissile Defense Agency -
Analysis Software for Near-Field Optical Microscopes
SBC: Field Precision Topic: N/AThe near-field scanning optical microscope can supply information on the shape and electrical properties of surfaces with nanometer resolution. The quantitative interpretation of images is difficult because of the difficulty of electromagnetic field solutions in the near-field limit. We propose to supply software to aid in this analysis. The finite-element programs generate two and three-dimension ...
SBIR Phase II 1998 Department of Commerce -
Si Wires in Silicon-On-Insulator Configuration
SBC: GRATINGS INCORPORATED Topic: N/AWe propose a systematic investigation of crystalline Si structures as their dimensions are reduced to quantum sizes (5-10 nm). For convenience, we have chosen Si on insulator (SOI) material for optical and electrical characterization. Our nanofabrication approach relies on simple laser interferometric lithography techniques that are uniquely adaptable to large area manufacturing. Suitable applic ...
SBIR Phase I 1995 Department of DefenseMissile Defense Agency -
VISUALIZATION OF BUILDING INFORMATION
SBC: Interface Engineering, Inc. Topic: N/AN/A
SBIR Phase I 1998 Department of Commerce