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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Fabrication of Affordable Aspheric Mirrors by Electroforming (FAAME)

    SBC: Advanced Optical Systems, Inc            Topic: N/A

    "Until recently, the cost of high performance electro-optical systems such as missile seekers has been dominated by the cost of the focal plane array. Recent developments are improving the affordability of arrays, with the result that the optical andopto-mechanical subsystems emerging as the cost drivers. We address this problem through the development of opto-mechanical systems built by precisi ...

    SBIR Phase II 2002 Department of DefenseMissile Defense Agency
  2. Significant Optical Manufacturing Advancement (SOMA) Process Development

    SBC: Advanced Optical Systems, Inc            Topic: N/A

    "Advanced Optical Systems (AOS) offers the Significant Optical Manufacturing Advancement (SOMA) Process Development program. We recognize that new technologies require an appropriate manufacturing process and that affordability is a significant factor ofany military system. Prototype systems require an investment in Design For Manufacturability and Assembly (DFMA), but often this funding is only a ...

    SBIR Phase I 2002 Department of DefenseMissile Defense Agency
  3. Low Jitter, Burst Mode Arbitrary Waveform Generation for LADAR Scene Projection

    SBC: Aegis Technologies Group, LLC, The            Topic: N/A

    "The effectiveness of LADAR scene projection in the development and testing of LADAR sensors in a hardware-in-the-loop environment is dependent on its ability to simulate LADAR return signals. Ideally, each pixel in the projection would be represented byan arbitrary (in time and intensity) optical waveform. However, the current capability for generating arbitrary optical waveforms can only produ ...

    SBIR Phase I 2002 Department of DefenseMissile Defense Agency
  4. MEMS Annular Rotating Sensor (MARS)

    SBC: Archangel Systems, Inc.            Topic: N/A

    "A MEMS rotating Annular Sensor (MARS) is proposed, which senses rotation velocities and accelerations in one discrete time sensor. The sensor system is sensitive to accelerations in all three local directions x, y, and z and rotational velocities in twoaxes. Differential capacitance measured at various points about the annulus permit a single MARS to measure accelerations in 3 degrees of freedom ...

    SBIR Phase I 2002 Department of DefenseMissile Defense Agency
  5. Precision Attitude Sensing on Aerostats (PASA)

    SBC: Archangel Systems, Inc.            Topic: N/A

    "Archangel's Air Data Attitude Heading Reference System (ADAHRS) is a solid-state unit that integrates low-cost piezoelectric MEMS gyros and accelerometers, as well as pitot and static sensing devices and a magnetometer with a local processor. Accuraciesto 1 degree RMS have been demonstrated in aircraft test flights. The gyro sensors used in the construction of the ADAHRS were low cost without re ...

    SBIR Phase I 2002 Department of DefenseMissile Defense Agency
  6. Development of an Isotropic Etching Method of Surface Preparation of SiC

    SBC: BANDGAP TECHNOLOGIES, INC.            Topic: N/A

    "This Phase I SBIR program is aimed at demonstrating the principle of an approach for the surface preparation of SiC wafers comparable or superior to chemo-mechanical polishing. In the Phase I program, surface preparation of 4H-SiC wafers 50 mm (2 inches)in diameter will be demonstrated. Also in Phase I, the prepared (treated) surface of the SiC wafer will be characterized for average surface ro ...

    SBIR Phase I 2002 Department of DefenseMissile Defense Agency
  7. An Approach for the Growth of Long Silicon Carbide Boules

    SBC: BANDGAP TECHNOLOGIES, INC.            Topic: N/A

    "This Phase I program is aimed at demonstrating the principle of an approach for the growth of 4H-SiC boules 50 mm in diameter but of length equal to 50 mm, which is approximately twice the length of boules grown by convential approaches. Also in Phase I,the grown boules will be sliced into wafers, lapped, and polished; the polished wafers will be characterized for structural properties; comparis ...

    SBIR Phase I 2002 Department of DefenseMissile Defense Agency
  8. Strain-Enhanced Tunnel Diode Technology

    SBC: Belford Research, Inc.            Topic: N/A

    "We intend to increase by an order of magnitude, the current density of silicon-based tunnel diodes. This increase directly relates to a corresponding increase in performance (speed). Apart from being the fastest of all microelectronic devices, tunneldiodes (TDs) have negative differential resistance, which gives them unusual circuit qualities. When attached to integrated circuits they improve the ...

    SBIR Phase I 2002 Department of DefenseMissile Defense Agency
  9. Germanium-Free Strained-SOI Wafers

    SBC: Belford Research, Inc.            Topic: N/A

    "We propose to combine the technologies of SOI manufacture with strain-inducing wafer bonding to produce Strained-Si On Insulator (SSOI) wafers. Optimizing this new Strained-Silicon-on-Insulator will increase carrier mobilities by a factor of at least x3,lower the band gap by 20%, and reduce operating power of existing technologies by a factor of x4. The above performance enhancements are over and ...

    SBIR Phase I 2002 Department of DefenseMissile Defense Agency
  10. Improved Temperature Measurement for High Yield Manufacturing

    SBC: Bellwether Instr., LLC            Topic: N/A

    "Bellwether proposed the development of an improved emissivity compensating pyrometer (ECP). This improved pyrometer will have advantages over conventional pyrometers including fewer measurement artifacts. Furthermore, the instrument will be initiallydeveloped for use with GaN processes, used for high power FET's and solar blind detectors. Improved process temperature measurement will lead to f ...

    SBIR Phase I 2002 Department of DefenseMissile Defense Agency
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