Award Data

NEAR-SURFACE DEFECTS IN SEMICONDUCTORS HAVE A PRIMARY INFLUENCE UPON DEVICE PROPERTIES, PARTICULARLY THE YIELD. IT WOULD BE VERY USEFUL TO BE ABLE TO MAP SPATIALLY THE DENSITY AND TYPE OF DEFECTS NEAR A SEMICONDUCTOR SURFACE EITHER AS A WAFER QUALITY CONTROL STEP OR TO SUPPORT DEVICE PHYSICAL EXPERIMENTS. CONVENTIONAL TECHNIQUES USED FOR THIS PURPOSE SUFFER FROM ONE OR MORE OF THE FOLLOWING LIMITA ...

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IN THIS PROGRAM, THE EFFORT WILL CONCENTRACTE ON ATTAINING A COMPLETE UNDERSTANDING OF THE PHYSICS INVOLVED IN INFERRING THE SHAPE OF THE FORWARD SURFACE OF A CARBON/CARBON NOSETIP FORM THE ECHO WAVESHAPE GENERATED BY A NULTRASONIC TRANSMITTER/RECEIVER MOUNTED ON THE BACK FACE. THE HIGHEST PRIORITY WILL BE FOCUSSED ON THE ABILITY TO IMPROVE THE INTERPRETATION OF PREVIOUS AND FUTURE FLIGHT DATA USI ...

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INVESTIGATE THE FEASIBILITY OF DESIGNING CIRCUITS TO ENABLE BETTER SECURE TRANSMISSION OF DATA. DEVELOP SPECIFIC APPROACHES FOR ACHIEVING SUCH DESIGN AND DETERMINE CORRESPONDING CHARACTERISTICS IN TERMS OF ADDITIONAL CIRCUITRY, RELIABILITY OF OPERATION, POSSIBILITY OF DETECTION, POSSIBILITY OF DISABLING OR COUNTERACTING, ACCIDENTAL SWITCHING, AND EASE OF INCORPORATION INTO EXISTING DESIGNS.

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AS AN UNBREACHABLE PERSONNEL IDENTIFICATION SYSTEM, WE PROPOSE TO COUPLE A VAPOR COLLECTOR TO A MASS SPECTROMETER IN ORDER TO PROFILE HUMAN VAPOR "SIGNATURES." THESE PROFILES OF CHEMICALLY COMPLEX "SIGNATURES" WILL THEN BE COMPARED TO A REFERENCES FILE USING A HIGHLY EFFECTIVE PATTERN MATCHING ALGORITHM. PHASE I EFFORT WILL DEMONSTRATE THE EXISTENCE OF THESE "SIGNATURES" AND SHOW THAT EXISTING INS ...

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