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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. A GaN-A1GaN CCD for UV Imaging Applications

    SBC: Apa Optics, Inc.            Topic: N/A

    N/A

    SBIR Phase I 1995 Department of DefenseAir Force
  2. High Power, Sub-Nanosecond Laser Diode Driver

    SBC: Aria Corp            Topic: N/A

    This proposal describes a new approach to laser diode drivers which combines the unique advantages of three key technologies. The innovative approach will extend the performance capabilities of laser diode systems to greater than 200 A peak pulse current, less than one nanosecond rise time, at greater than 10 KHz repetition rates. Not customarily used in laser diode drivers, the unique combinati ...

    SBIR Phase I 1995 Department of DefenseAir Force
  3. Compact High Heat-Flux Cannister Cooler

    SBC: ISOTHERMAL SYSTEMS RESEARCH            Topic: N/A

    The miniaturization of the laser diode, power switches (MCT, IGBT, etc.), the drastic increase in the number density of transistors on a monolithic chip and the capability to drive these chips at very high power ratings and clock speeds has increased the demand for the devices. However, such high performance can be extracted only over short time pulses because the devices produce a moderate amoun ...

    SBIR Phase I 1995 Department of DefenseAir Force
  4. Low Cost, Dual Use Envirnmental Measurement Device (END)- Phase I

    SBC: Event Tracking Service            Topic: N/A

    Event Tracking Service (ETS) proposes to study the feasibility of developing a low cost ($50), self-contained, dual use, miniature, credit card size Environmental Measurement Device (EMD) to sense and log shock, vibration, temperature, and humidity. The device would be readily expandable to monitor other parameters. Our low power architecture includes 3V off-the-shelf CMOS electronics, a low power ...

    SBIR Phase II 1995 Department of DefenseAir Force
  5. An Improved Material and Low-Cost Fabrication Options for Candle Filters

    SBC: Fluidyne Engineering Corp.            Topic: N/A

    N/A

    SBIR Phase I 1995 Department of Energy
  6. HEMT and HBT Process Design

    SBC: Gateway Modeling, Inc            Topic: N/A

    N/A

    SBIR Phase I 1995 Department of DefenseAir Force
  7. Short Link optical communication system for high data capacity applications

    SBC: Lar-n-mar Enterprises, Inc.            Topic: N/A

    Testing of sophisticated integrated avionics equipment installed on aircraft, requires high capacity data to be transferred from the signal source to the aircraft. The aircraft performance and safety depends on the quality of the test. Quality and cost of the test depend on speed and reliability of the communication link. For the test purity, cable fiber optic link, or electromagnetic type of c ...

    SBIR Phase I 1995 Department of DefenseAir Force
  8. Advanced Chemiresistor Devices as Micron Size Sensors for the Rapid, On-Line Measurement of Chemical Vapors

    SBC: Microsensor Systems Inc.            Topic: N/A

    N/A

    SBIR Phase I 1995 Department of Energy
  9. Chemical Microsensor Arrays as Integrated Chip Compatible Devices for Chemical Weapons Nonproliferation Inspection

    SBC: Microsensor Systems Inc.            Topic: N/A

    N/A

    SBIR Phase I 1995 Department of Energy
  10. Generation and Deposition of Nanoscale Particles for Reference Wafers

    SBC: MSP CORPORATION            Topic: N/A

    In the semiconductor industry, standard reference wafers are needed for calibrating wafer surface scanners. Scanners are currently available for detecting particles down to a lower size limit of approximately 100 nm (0.1 um). Advanced wafer scanners capable of detecting particles to 60 nm will be needed for future generation of devices such as the 1 Gbit DRAMs (dynamic random access memory) expe ...

    SBIR Phase I 1995 Department of Commerce
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