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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. ANALYSIS OF PROCESS INDUCED DAMAGE BY SUBSURFACE SCATTER MEASUREMENT

    SBC: Toomay Mathis & Associates Inc            Topic: N/A

    LIGHT SCATTERED FROM CLEAN SEMICONDUCTOR WAFERS IS DUE TO BOTH SURFACE AND SUBSURFACE DEFECTS. SCATTER FROM SURFACE DEFECTS GENERALLY DOMINATES BY AN ORDER OF MAGNITUDE OR TWO. A METHOD TO SEPARATE SUBSURFACE SCATTER FROM SURFACE SCATTER HAS BEEN FOUND, AND IT IS PROPOSED HERE TO UTILIZE THAT TECHNIQUE TO INDICATE THE LOCATION AND AMPLITUDE OF SUBSURFACE DEFECTS BY COLOR MAPPING THE LOCATION AND I ...

    SBIR Phase I 1987 Department of DefenseAir Force
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