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The Award database is continually updated throughout the year. As a result, data for the given year is not complete until April of the following year. Annual Reports data is a snapshot of agency reported information for that year and hence might look different from the live data in the Awards Information charts.

  1. Thickness Measurement Technology for Thin Films on Sapphire Substrate

    SBC: Advanced Cooling Technologies, Inc.            Topic: DMEA16B-001

    Silicon-on-sapphire (SOS) integrated circuits are attracting attention due to their high speed performance and low power consumption. An important aspect of the SOS fabrication process that must be verified to maximize yield is the thickness of the thin films deposited on the sapphire substrate. However, due to the transparent nature of sapphire, current optical metrology tools are not applicable. ...

    STTR Phase I 2017 Department of DefenseDefense Microelectronics Activity
  2. Metrology of thin films on sapphire substrate

    SBC: Optowares Incorporated            Topic: DMEA16B-001

    There is a lack of non-destructive metrology tool to measure the thickness of thin films on sapphire substrate due to the transparency of the

    STTR Phase I 2017 Department of DefenseDefense Microelectronics Activity
  3. High-brilliance 11keV X-ray Source

    SBC: Sigray, Inc.            Topic: DMEA162-001

    This Small Business Innovation Proposal aims to establish the feasibility of developing a high flux x-ray source using a patent-pending microstructured anode comprised of Platinum microstructures embedded in a diamond substrate. The resulting source will provide a breakthrough in achievable throughput for the application of rapid integrated circuit (IC) inspection, due to two major innovative adva ...

    SBIR Phase I 2017 Department of DefenseDefense Microelectronics Activity
  4. Ferroelectric X-Ray Generator (FLEX)

    SBC: Luminit LLC            Topic: DMEA162-001

    To address the DMEA need for rapid x-ray inspection of large volumes of integrated circuits (ICs), Luminit, LLC, proposes to develop a new compact, high-brilliance x-ray source: the Ferroelectric X-Ray Generator (FLEX). This proposed device is based on an innovative combination of a ferroelectric, photogalvanic crystal combined with an undulator. The innovation in the physical principles of compac ...

    SBIR Phase I 2017 Department of DefenseDefense Microelectronics Activity
  5. Ultra-high Speed High Brightness X-ray Source

    SBC: CREARE LLC            Topic: DMEA162-001

    High brightness x ray sources are large and expensive due to the extreme thermal conditions produced when generating the x rays. Creare proposes to advance the brightness of x ray sources in the 9-11 keV range beyond the current state-of-the-art using an innovative thermal design that builds on Creares experience in high-heat flux thermal management, vacuum systems, and precision machinery. Duri ...

    SBIR Phase I 2017 Department of DefenseDefense Microelectronics Activity
  6. High-Efficiency Integrated Si APD Quantum Key Receiver

    SBC: Freedom Photonics LLC            Topic: DMEA142-001

    Abstract

    SBIR Phase II 2017 Department of DefenseDefense Microelectronics Activity
  7. Rapid Non-destructive Detection of Advanced Counterfeit Electronic Material

    SBC: NOKOMIS, INC            Topic: DMEA152-001

    Counterfeit and maliciously modified electronics can disrupt, disable, and subvert Department of Defense (DoD) weapons systems crucial to national security. When coupled with the growing sophistication of counterfeits and physical malware, the need for advanced detection technology is apparent. Conventional screening technologies have proven incapable of robust and reliable counterfeit ...

    SBIR Phase II 2017 Department of DefenseDefense Microelectronics Activity
  8. Rapid and Agile Detection of Counterfeit Electronics using Enhanced ADEC Technology

    SBC: NOKOMIS, INC            Topic: DMEA152-001

    Counterfeit and maliciously modified electronics can disrupt, disable, and subvert Department of Defense (DoD) weapons systems crucial to national security. When coupled with the growing sophistication of counterfeits and physical malware, the need for advanced detection technology is apparent. Conventional screening technologies have proven incapable of robust and reliable counterfeit detection ...

    SBIR Phase I 2016 Department of DefenseDefense Microelectronics Activity
  9. High-Resolution X-ray Microscopy Image Acquisition, 3D Reconstruction, and Analysis Software System

    SBC: PHYSICAL OPTICS CORPORATION            Topic: DMEA152-002

    To address the DMEA need for algorithms and software to accurately analyze data from X-ray microscopy of integrated circuits (ICs), Physical Optics Corporation (POC) proposes to develop a new X-ray Microscopy Image Acquisition, 3D Reconstruction, and Analysis Software (XARA) system for rapid identification and mapping of conductors of ICs. It is based on (a) novel swing nanolaminography image ac ...

    SBIR Phase I 2016 Department of DefenseDefense Microelectronics Activity
  10. Analysis of Integrated Circuits Using Limited X-rays

    SBC: Lickenbrock Technologies LLC            Topic: DMEA152-002

    There exists currently a need to non-destructively evaluate the construction of integrated circuits (ICs) that will ensure the trust of ICs used in military systems, but designed and fabricated under untrusted conditions. An X-ray microscope (XRM) equipped with a lab X-ray source will be used to fill this need. The drawbacks to this system are prohibitively long acquisition times due to reduced ...

    SBIR Phase I 2016 Department of DefenseDefense Microelectronics Activity

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