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The Award database is continually updated throughout the year. As a result, data for the given year is not complete until April of the following year. Annual Reports data is a snapshot of agency reported information for that year and hence might look different from the live data in the Awards Information charts.

  1. Rapid and Agile Detection of Counterfeit Electronics using Enhanced ADEC Technology

    SBC: Nokomis, Inc            Topic: DMEA152-001

    Counterfeit and maliciously modified electronics can disrupt, disable, and subvert Department of Defense (DoD) weapons systems crucial to national security. When coupled with the growing sophistication of counterfeits and physical malware, the need for advanced detection technology is apparent. Conventional screening technologies have proven incapable of robust and reliable counterfeit detection ...

    SBIR Phase I 2016 Department of DefenseDefense Microelectronics Activity
  2. High-Resolution X-ray Microscopy Image Acquisition, 3D Reconstruction, and Analysis Software System

    SBC: Physical Optics Corporation            Topic: DMEA152-002

    To address the DMEA need for algorithms and software to accurately analyze data from X-ray microscopy of integrated circuits (ICs), Physical Optics Corporation (POC) proposes to develop a new X-ray Microscopy Image Acquisition, 3D Reconstruction, and Analysis Software (XARA) system for rapid identification and mapping of conductors of ICs. It is based on (a) novel swing nanolaminography image ac ...

    SBIR Phase I 2016 Department of DefenseDefense Microelectronics Activity
  3. Analysis of Integrated Circuits Using Limited X-rays

    SBC: Lickenbrock Technologies Inc.            Topic: DMEA152-002

    There exists currently a need to non-destructively evaluate the construction of integrated circuits (ICs) that will ensure the trust of ICs used in military systems, but designed and fabricated under untrusted conditions. An X-ray microscope (XRM) equipped with a lab X-ray source will be used to fill this need. The drawbacks to this system are prohibitively long acquisition times due to reduced ...

    SBIR Phase I 2016 Department of DefenseDefense Microelectronics Activity
  4. Analysis of Integrated Circuits Using Limited X-rays

    SBC: Tangent Sciences, LLC            Topic: DMEA152-002

    Tangent Sciences develops XRadIC as an automated software framework to non-destructively analyze cutting edge microelectronics using photon flux-limited x-ray microscope systems. XRadIC couples on-the-fly sample scanning with online optimized 2D and 3D image analysis algorithms to maximize overall system throughput by dynamically minimizing the number of viewing angles and exposure times needed ...

    SBIR Phase I 2016 Department of DefenseDefense Microelectronics Activity
  5. ZnS Scintillator for High Resolution X-ray Imaging at 9keV

    SBC: CeraNova Corporation            Topic: DMEA15B-001

    Novel scintillator materials are needed to address the requirements of fast, high resolution x-ray microscopy, including higher stopping power and light yields. Achieving the required high efficiency and high spatial resolution is challenging and depends strongly on the scintillator characteristics. Knowledge of the details of the trap states can lead to significantly reduced afterglow and fast ...

    SBIR Phase I 2016 Department of DefenseDefense Microelectronics Activity
  6. New Sensor for 9 keV HRXM

    SBC: Radiation Monitoring Devices, Inc.            Topic: DMEA15B-001

    The use of penetrating radiation such as x-rays allows probing materials for their internal structure through direct imaging methods in a non-destructive way. X-rays as more penetrating and with shorter wavelengths than visible light allow imaging internal structures with better resolution. The resolution of details can reach nm sizes. This is realized in High Resolution X-ray Microscopy (HRXM). ...

    SBIR Phase I 2016 Department of DefenseDefense Microelectronics Activity
  7. High-Efficiency, High-Resolution Scintillator

    SBC: Physical Optics Corporation            Topic: DMEA15B-001

    To address the DMEA need for high-resolution scintillators for X-ray microscopy, Physical Optics Corporation (POC) proposes to develop a new High-Efficiency, High-Resolution Scintillator (HEROS). This proposed technology solution is a thin-film scintillator design, which uses a high-density, high-Z-number material with high X-ray stopping power. Specifically, the innovation in the scintillator m ...

    SBIR Phase I 2016 Department of DefenseDefense Microelectronics Activity
  8. Nano-Resolution Three-Dimensional Integrated Circuit Reconstruction System

    SBC: Physical Optics Corporation            Topic: DMEA132-002

    To address the DMEA need for accurate identification and analysis of semiconductor materials with high-resolution imaging of integrated circuits (ICs), Physical Optics Corporation (POC) developed and evaluated the feasibility of novel Nano-Resolution Three-Dimensional Integrated Circuit Reconstruction (NEOTERIC) System for in situ full reverse engineering of ICs based on swing nanolaminography a ...

    SBIR Phase II 2016 Department of DefenseDefense Microelectronics Activity
  9. Quantum Cryptography Single Photon Detector Chip

    SBC: AET, Inc.            Topic: DMEA142-001

    AET will perform R&D to develop a quantum cryptographic single photon counting system (or detector) consisting of a high performance integrated circuit chip and detector (such as an avalanche photodiode) for use in a secure fiber optic communications link. Quantum cryptography applies an encryption scheme that uses a series of single, polarized photons that act as the key between the sender an ...

    SBIR Phase I 2015 Department of DefenseDefense Microelectronics Activity
  10. High-Efficiency Integrated Si APD Quantum Key Receiver

    SBC: Freedom Photonics LLC            Topic: DMEA142-001

    High-efficiency detectors capable of single photon detection are one of the key technologies required for adoption of QKD technology. These detection systems need to be made more robust, to be offered at lower cost, and to move out of the laboratory to provide ubiquitous commercial access. Freedom Photonics will develop a highly integrated and compact single photon avalanche photodetector with ...

    SBIR Phase I 2015 Department of DefenseDefense Microelectronics Activity

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